Proceedings of the Korean Society of Precision Engineering Conference (한국정밀공학회:학술대회논문집)
- 2005.06a
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- Pages.637-640
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- 2005
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- 2005-8446(pISSN)
Atomic Force Microscope Probe Calibration by use of a Commercial Precision Balance
정밀저울을 이용한 원자힘 현미경 캔티레버의 특성평가
Abstract
In this paper, we investigate the characteristics of a piezoresistive AFM cantilever in the range of
Keywords