Nano Force Metrology and Standards

나노 힘 측정 및 표준

  • Kim M.S. (Div. of Physical Metrology, KRISS) ;
  • Park Y.K. (Div. of Physical Metrology, KRISS) ;
  • Choi J.H. (Div. of Physical Metrology, KRISS) ;
  • Kim J.H. (Div. of Physical Metrology, KRISS) ;
  • Kang D.I. (Div. of Physical Metrology, KRISS)
  • Published : 2005.10.01

Abstract

Small force measurements ranging from 1 pN to $100{\mu}N$, we call it Nano Force, become the questions of common interests of biomechanics, nanomechanics, material researches, and so on. However, unfortunately, quantitative and accurate force measurements have not been taken so far. This is because there ,are no traceable force standards and a calibration scheme. This paper introduces a quantitative force metrology, which provides traceable link to SI (International Systems of Units). We realize SI traceable force ranging from 1 nN to $100{\mu}N$ using an electrostatic balance and disseminate it through transfer standards, which are self-sensing cantilevers that have integrated piezoresistive strain gages. We have been built a prototype electrostatic balance and Nano Force Calibrator (NFC), which is an AFM cantilever calibration system. As a first experiment, we calibrated normal spring constants of commercial AFM cantilevers using NFC. Calibration results show that the spring constants of them are quite differ from each other and nominal values provided by a manufacturer (up to 240% deviation).

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