Structural and electrical characterization of Mgo thin films grown on various ferromagnetic substrates

  • Cho Y.J. (Nano Fabrication Center, Samsung Advanced Institute of Technology) ;
  • Hwang I.J. (Nano Fabrication Center, Samsung Advanced Institute of Technology) ;
  • Kim K.W. (Nano Devices Lab, Samsung Advanced Institute of Technology) ;
  • Kim K.S. (Material Science and Engineering, Gwangju Institute of Science & Technology) ;
  • Kim T.W. (Nano Devices Lab, Samsung Advanced Institute of Technology) ;
  • Hwang C.S. (School of Materials Science and Engineering, Seoul National University(College of Engineering))
  • Published : 2005.12.01