한국품질경영학회:학술대회논문집 (Proceedings of the Korean Society for Quality Management Conference)

한국품질경영학회 (Korean Society for Quality Management)
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HALT와 고장분석을 이용한 STN LCD 모듈의 신뢰성 평가에 관한 연구

Anapproach of Combining HALT and Failureanalysis for STNLCD Reliability Assessment

  • 강보철 (전자부품연구원 신뢰성평가센터) ;
  • 홍원식 (전자부품연구원 신뢰성평가센터) ;
  • 조재립 (경희대학교 산업공학과)
  • Kang Bo-Chul (Reliability & Failure Analysis Center, KETI) ;
  • Hong Won-Sik (Reliability & Failure Analysis Center, KETI) ;
  • Cho Jai-Rip (Dept. of Industrial Engineering, Kyung Hee University)
  • 발행 : 2004.04.01
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초록

This brief paper is an application of HALT(High Accelerated Life Test) and FA(Failure analysis) to improvement of STN LCD module. Before HALT the result of environmental test is good. So, we choose the technique of HALT to evaluate reliability. After HALT and Fa, we suggest some methods to improve reliability

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