Proceedings of the Korean Society for Quality Management Conference (한국품질경영학회:학술대회논문집)
- 2004.04a
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- Pages.64-69
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- 2004
두 개의 이상원인을 고려한 VSSI $\bar{X}$ 관리도의 통계적 특성
Abstract
This research investigates statistical characteristics of variable sampling size & interval(VSSI) X charts under two assignable causes. Algorithms for calculating the average run length(ARL) and average time to signal(ATS) of the VSSI X chart are proposed by employing Markov chain method. Extensive sensitivity analysis shows that the VSSI. X chart is superior to the VSS or VSI X chart as well as to the Shewhart X chart in statistical sense, even under two assignable causes.
Keywords