CMM(Compact Camera Module) Defect Inspection

CMM(Compact Camera Module) 불량 검사

This paper deals with the algorithm development that inspects defects such as Lens Focus, Black Defect, Dim Defect, Color Defect, White Balance, and Line Defect caused by the process of Compact Camera Module (CCM). These days the demand of CCM goes on increasing in various types like PDA, a cellular phone and PC camera every year. However, owing to the defect inspection of CCM by the semiskilled work the average inspection time of CCM takes about 40 to 50 seconds. As time goes by the efficiency takes a sudden turn for the worse because workers must inspect with seeing a monitor directly. In this paper, to solve these problems, we developed the imaging processing algorithm to inspect the defects in captured image of assembled CCM. The performances of the developed inspection system and its algorithm are tested on many samples. Experimental results reveal that the proposed system can focus the lens of CCM within 5s and we can recognize various types of defect of CCM modules with good accuracy and high speed.