Gate effect on Hall voltage in a Hybrid InSb/Ferromagnet device

  • Kim W. Y. (Nano Device Research Center, Korea Institute of Science and Technology) ;
  • Chang Joonyeon (Nano Device Research Center, Korea Institute of Science and Technology) ;
  • Han S. H. (Nano Device Research Center, Korea Institute of Science and Technology) ;
  • Chang S. G. (Epixon CO., Ltd) ;
  • Lee W. Y. (Department of Materials Science and Engineering, Yonsei University)
  • Published : 2004.12.01