Proceedings of the Korean Vacuum Society Conference (한국진공학회:학술대회논문집)
- 2003.02a
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- Pages.125-125
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- 2003
The characteristic carrier-Er interaction distance in Er-doped a-Si/SiO2 superlattices formed by ion sputtering
- Jhe, Ji-Hong (Dept. of Physics, Korea Advanced Institute of Science and Technology(KAIST)) ;
- Shin, Jung-H. (Dept. of Physics, Korea Advanced Institute of Science and Technology(KAIST)) ;
- Kim, Kyung-Joong (Nano Surface Group, Korea Research Institute of Standard and Science(KRISS)) ;
- Moon, Dae-Won (Nano Surface Group, Korea Research Institute of Standard and Science(KRISS))
- Published : 2003.02.14
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