Proceedings of the Korean Vacuum Society Conference (한국진공학회:학술대회논문집)
- 2003.02a
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- Pages.103-103
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- 2003
Effect of Energy Levels of Organic Reist on Atomic Force Microscope Lithography
- Shin, Wan-Sup (Department of Chemistry, Hanyang University) ;
- Lee, Hai-Won (Department of Chemistry, Hanyang University)
- Published : 2003.02.14
Abstract
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