Microwave Dielectric Properties of $0.7Mg_4Ta_2O_9-0.3TiO_2$ Ceramics with Sintering Temperature

소결온도에 따른 $0.7Mg_4Ta_2O_9-0.3TiO_2$ 세라믹스의 마이크로파 유전특성

  • Published : 2003.05.16

Abstract

The microwave dielectric properties of $0.7Mg_4Ta_2O_9-0.3TiO_2$ ceramics were investigated. All samples were prepared by the conventional mixed oxide method. The structural properties were investigated with sintering temperature by X-ray Diffractor meter. According to. the X-ray diffraction patterns of the $0.7Mg_4Ta_2O_9-0.3TiO_2$ ceramics, major phase of the hexagonal $Mg_4Ta_2O_9$ were appeared. In the case of $0.7Mg_4Ta_2O_9-0.3TiO_2$ ceramics sintered at $1400^{\circ}C$, dielectric constant, quality factor and temperature coefficient of resonant frequency were 11.72, 126,419GHz, $-31.82ppm/^{\circ}C$, respectively.

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