Proceedings of the Korea Electromagnetic Engineering Society Conference (한국전자파학회:학술대회논문집)
- 2003.11a
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- Pages.140-144
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- 2003
Failure Analysis of RF SAW Filter by High Temperature Storage Test
고온저장시험에 의한 RF SAW Filter의 고장분석
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Kim, Young-Goo
(Electronics and Telecommunication Research Institute)
;
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Kim, Tae-Hong
(Electronics and Telecommunication Research Institute)
;
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You, Jong-Jun
(Electronics and Telecommunication Research Institute)
- Published : 2003.11.15
Abstract
To investigate failure analysis of surface acoustic wave (SAW) filter for radio frequency, high temperature storage test was carried out. The failure criteria were insertion loss at passband and rejection level at stopband. As a result, the insertion loss at passband increase about 4 dB was due to damages of interdigital transducer (IDT). That is caused by poor adhesion between metal electrode(AI) and piezoelectric substrate and defects on a manufacturing process. This result indicates that good adhesion between electrode and ceramic substrate is important factor And also we investigated the demage factors of electrode. Screen possible of saw filter using high temperature storage test(HTOL) in the manufacturing phase be presented.