Proceedings of the Optical Society of Korea Conference (한국광학회:학술대회논문집)
- 2003.02a
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- Pages.22-23
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- 2003
Surface Dynamics using Coherent X-rays : X-ray Photon Correlation Spectroscopy
코히런트한 X-선을 이용한 표면 거동 연구
Abstract
The new method of x-ray photon correlation spectroscopy (XPCS) [1] is developed recently for probing the dynamics of surface height fluctuations as a function of lateral length scale. Measurements were performed on supported polystyrene (PS) films of thicknesses varying from 84 to 333 nm at temperatures above the PS glass transition temperature. Within a range of wave vectors spanning
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