대한전자공학회:학술대회논문집 (Proceedings of the IEEK Conference)
- 대한전자공학회 2003년도 하계종합학술대회 논문집 II
- /
- Pages.1145-1148
- /
- 2003
CMOS 드라이버 구동상태에서 SSN을 줄이기 위한 Separate Bulk Modeling 및 효과
Separate Bulk Modeling and effect to reduce Simultaneous Switching Noise in CMOS Driver Loading Conditions
- Choi, Sung-Il (Dept. of Electronic Engineering, Hallym University) ;
- Wee, Jae-Kyung (Dept. of Electronic Engineering, Hallym University) ;
- Moon, Gyu (Dept. of Electronic Engineering, Hallym University)
- 발행 : 2003.07.01