대한전자공학회:학술대회논문집 (Proceedings of the IEEK Conference)
- 대한전자공학회 2003년도 하계종합학술대회 논문집 II
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- Pages.703-706
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- 2003
반도체 EDS공정에서의 패턴인식기법을 이용한 불량 유형 자동 분류 방법 연구
Automatic classification of failure patterns in semiconductor EDS Test using pattern recognition
초록
Yield enhancement in semiconductor fabrication is important. It is ideal to prevent all the failures. However, when a failure occurs, it is important to quickly specify the cause stage and take countermeasure. The automatic method of failure pattern extraction from fail bit map provides reduced time to analysis and facilitates yield enhancement. This paper describes the techniques to automatically classifies a failure pattern using a fail bit map, a new simple schema which facilitates the failure analysis.
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