MOD법에 의한 coated conductor용 $Y_{2}$$O_{3}$ 완충층의 제조

Fabrication of $Y_{2}$$O_{3}$ buffer layers for coated conductor via MOD process

Y$_2$O$_3$ buffer layers have been fabricated on Ni tapes via MOD process. Films were annealed either in reductive or oxidative condition Successfully (200) orientated buffer layers were grown. The out-of-plane orientation of film were characterized by Δ$\theta$ is about 5.4$^{\circ}$. Although films prepared with acetic acid contains a large amount of microcrack, those prepared with 2-MOE(2-methoxy ethanol) exhibit a crack-free surface.