Redundant fault characterization of speed independent circuits

속도독립회로의 무해고장특성

This paper addresses a characterization of fault effects in asynchronous circuits. A characterization has been performed on races caused by a single stuck-at faults (SSAF). The faults sometimes lead to races in faulty circuits, which prevent faults from observing and the circuit is insufficiently tested. To identify those obstacles, we have proposed non-detectable single stuck-at fault(NDSSAF) conditions and proposed an algorithm to find them. In the help of the proposed methodology, the asynchronous circuits can be fully SSAF testable.