Determination of Indium composition of InGaN thin films and multiple quantum wells using anomalous x-ray scattering

  • Lee, H.H. (Department of Materials Science and Engineering, Kwangju Institute of Science and Technology) ;
  • Yi, M.S. (Department of Materials Science and Engineering, Kwangju Institute of Science and Technology) ;
  • Jang, H.W. (Department of Materials Science and Engineering, Kwangju Institute of Science and Technology) ;
  • Moon, Y.T. (Department of Materials Science and Engineering, Kwangju Institute of Science and Technology) ;
  • Park, S.J. (Department of Materials Science and Engineering, Kwangju Institute of Science and Technology) ;
  • Noh, D.Y. (Department of Materials Science and Engineering, Kwangju Institute of Science and Technology) ;
  • Tang, M. (Synchrotron Radiation Research Center) ;
  • Liang, K.S. (Synchrotron Radiation Research Center)
  • Published : 2002.06.27