X-ray scattering study of copper-filling profile in submicron trenches

  • Kim, Sang-Soo (Department of Materials Science and Engineering, Kwangju Institute of Science and Technology) ;
  • Kang, Hyun-Chul (Department of Materials Science and Engineering, Kwangju Institute of Science and Technology) ;
  • Noh, Do-Young (Department of Materials Science and Engineering, Kwangju Institute of Science and Technology) ;
  • Yun, Jong-Min (Department of Materials Science and Engineering, Seoul National University) ;
  • Joo, Young-Chang (Department of Materials Science and Engineering, Seoul National University)
  • Published : 2002.06.27