Low-Frequency Noise Properties in Single Layer thin Film High-$T_c$ SQUID Gradiometers

  • Hwang, Tae-Jong (Korea Research Institute of Standards and Science, Yeungnam University) ;
  • Kim, In-Seon (Korea Research Institute of Standards and Science) ;
  • Kim, D.H. (Yeungnam University) ;
  • Park, Yong-Ki (Korea Research Institute of Standards and Science)
  • Published : 2002.08.20