Proceedings of the Korea Information Processing Society Conference (한국정보처리학회:학술대회논문집)
- 2002.04a
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- Pages.631-634
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- 2002
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- 2005-0011(pISSN)
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- 2671-7298(eISSN)
A Study on the Hump Characteristics of the MOSFETs
MOSFET의 험프 특성에 관한 연구
- Kim, Hyeon-Ho (Dept of Electronic Information, Chungbuk Provincial University of Science & Technology) ;
- Lee, Yong-Hui (Dept of Computer Application, Shinsung College) ;
- Yi, Jae-Young (Technical Univ. of Budapest) ;
- Yi, Cheon-Hee (Dept of Electronic Engineering, Cheong-ju University)
- Published : 2002.04.12
Abstract
In this paper we improved that hump occurrence by increased oxidation thickness, and control field oxide recess
Keywords