Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference (한국전기전자재료학회:학술대회논문집)
- 2001.05a
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- Pages.47-51
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- 2001
The Study on Surface of Devices Using Fractal.
프랙탈을 이용한 소자 표면의 고찰
- Published : 2001.05.11
Abstract
The structural properties of varistors surface studied by fractal phenomenon were investigated to verify the relations of electrical characteristics. The SEM photograph of varistors surface were changed by binary code and the grain shape of that were analyzed by fractal dimension. The void of varistors surface was found by fractal program. The relation between grain density and electrical properties depend on fractal dimension. The grain size in varistors surface was decreased by increasing of oxide antimony addition. The grain size of devices by oxide antimony addition were from 5 to
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