Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference (한국전기전자재료학회:학술대회논문집)

The Korean Institute of Electrical and Electronic Material Engineers (한국전기전자재료학회)
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The Study on Surface of Devices Using Fractal.

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  • 홍경진 (광주대학교 컴퓨터전자통신공학부) ;
  • 김창원 (광주대학교 컴퓨터전자통신공학부) ;
  • 조재철 (초당대학교 전자공학과)
  • Published : 2001.05.11
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Abstract

The structural properties of varistors surface studied by fractal phenomenon were investigated to verify the relations of electrical characteristics. The SEM photograph of varistors surface were changed by binary code and the grain shape of that were analyzed by fractal dimension. The void of varistors surface was found by fractal program. The relation between grain density and electrical properties depend on fractal dimension. The grain size in varistors surface was decreased by increasing of oxide antimony addition. The grain size of devices by oxide antimony addition were from 5 to $10[{\mu}m]$. The fractal dimension and electrical properties of varistors surface was related to between grain boundary and grain density. The grain size was decreased by increasing of fractal dimensions.

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