전자레인지용 고압다이오드의 방열특성

Heat Dissipation Analysis of High Voltage Diode Package for Microwave oven

  • 김상철 (한국전기연구원 전력반도체그룹) ;
  • 김남균 (한국전기연구원 전력반도체그룹) ;
  • 방욱 (한국전기연구원 전력반도체그룹) ;
  • 서길수 (한국전기연구원 전력반도체그룹) ;
  • 문성주 (삼성전기) ;
  • 오방원 (삼성전기)
  • 발행 : 2001.11.08

초록

Steady state and transient thermal analysis has been done by a finite element method in a diode of 12kV blocking voltage for microwave oven. The diode was fabricated by soldering ten pieces of 1200V diodes in series, capping a dummy wafer at the far end of diode series, and finally copper wire bonded for building anode and cathode terminal. In order to achieve high voltage and reliability, the edge of each diode was beveled and passivated by resin and epoxy with a thickness of $25{\mu}m$ and $3700{\mu}m$, respectively. The chip size, thickness and material properties were very important factor for high voltage diode package. And also, thermal stress value was highest in the edge of diode and solder. So, design of edge in silicon was very important to thermal stress.

키워드