Proceedings of the IEEK Conference (대한전자공학회:학술대회논문집)
- 2000.11b
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- Pages.59-62
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- 2000
A New Test Algorithm for High-Density Memories
고집적 메모리를 위한 새로운 테스트 알고리즘
- Kang, Dong-Chual (School of Electrical Engineering and Automation, Univ. of Ulsan) ;
- Cho, Sang-Bock (School of Electrical Engineering and Automation, Univ. of Ulsan)
- Published : 2000.11.01
Abstract
As the density of memories increases, unwanted interference between cells and coupling noise between bit-lines are increased and testing high density memories for a high degree of fault coverage can require either a relatively large number of test vectors or a significant amount of additional test circuitry. From now on, conventional test algorithms have focused on faults between neighborhood cells, not neighborhood bit-lines. In this paper, a new algorithm for NPSFs, and neighborhood bit-line sensitive faults (NBLSFs) based on the NPSFs are proposed. Instead of the conventional five-cell and nine-cell physical neighborhood layouts to test memory cells, a three-cell layout which is minimum size for NBLSFs detection is used. To consider faults by maximum coupling noise by neighborhood bit-lines, we added refresh operation after write operation in the test procedure(i.e., write \longrightarrow refresh \longrightarrow read). Also, we present properties of the algorithm, such as its capability to detect stuck-at faults, transition faults, conventional pattern sensitive faults, and neighborhood bit-line sensitive faults.
Keywords