Proceedings of the IEEK Conference (대한전자공학회:학술대회논문집)

The Institute of Electronics and Information Engineers (대한전자공학회)
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Implementation of Gummel-Poon model parameter Extraction Program for a bipolar transistor

바이폴라 트랜지스터의 Gummel Poon 등가회로 파라미터 추출 프로그램의 구현

  • Published : 2000.11.01
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Abstract

DC Gummel-Poon SPICE model parameter extraction program has been implemented. This program extracts the parameters from measured data using Levenberg-Marquardt algorithm. Measured data consist of forward and reverse Gummel plot, forward and reverse output characteristics and RE and RC measurements.

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