대한전자공학회:학술대회논문집 (Proceedings of the IEEK Conference)
- 대한전자공학회 2000년도 추계종합학술대회 논문집(1)
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- Pages.353-356
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- 2000
다중 바이어스 추출 기법을 이용한 HEMT 소신호 파라미터 추출
Parameter Extraction of HEMT Small-Signal Equivalent Circuits Using Multi-Bias Extraction Technique
초록
Multi-bias parameter extraction technique for HEMT small signa] equivalent circuits is presented in this paper. The technique in this paper uses S-parameters measured at various bias points in the active region to construct one optimization problem, of which the vector of unknowns contains only a set of bias-independent elements. Tests are peformed on measured S-parameters of a pHEMT at 30 bias points. Results indicate that the calculated S-parameters is similar to the measured data.
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