Proceedings of the IEEK Conference (대한전자공학회:학술대회논문집)

The Institute of Electronics and Information Engineers (대한전자공학회)
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Practical Fault Coverage of Supply Current Testing for Open Fault in TTL Combinational Circuits

  • Mushiaki, Yukiko (Department of Electrical and Elecrtronic Engineering Faculty of Engineering, The Univ. of Tokushima) ;
  • Hashzume, Masaki (Department of Electrical and Elecrtronic Engineering Faculty of Engineering, The Univ. of Tokushima) ;
  • Yotsuyanagi, Hiroyuki (Department of Electrical and Elecrtronic Engineering Faculty of Engineering, The Univ. of Tokushima) ;
  • Tamesada, Takeomi (Department of Electrical and Elecrtronic Engineering Faculty of Engineering, The Univ. of Tokushima)
  • Published : 2000.07.01
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Abstract

There are some variations in quiescent supply current or TTL SSIs. Thus, some variations in quiescent supply current of logic circuits made of TTL SSIs will be generated. The variations make it difficult to apply supply current test methods to tests of TTL circuits. In this paper, in order to examine the applicability to R circuits, fault coverages of a supply current test method for open faults in some ISCAS-85 benchmark circuits are evaluated, Which are made of TTL LS-type SSIs. The experimental results shows that if SSIs are used for implementation having the variation of quiescent supply current within 1%, supply current test methods are applicable for the tests.

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