Proceedings of the IEEK Conference (대한전자공학회:학술대회논문집)

The Institute of Electronics and Information Engineers (대한전자공학회)
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A Novel Testing Method for Operational Amplifier Using Offset and High Frequency

오프셋과 고주파수를 이용한 연산증폭기의 새로운 테스트 방식

  • 송근호 (경상대학교 전자공학과) ;
  • 백한석 (경상대학교 전자공학과) ;
  • 문성룡 (경상대학교 전자공학과) ;
  • 서정훈 (창원전문대 전자통신과) ;
  • 김강철 (여수대학교 컴퓨터공학과) ;
  • 한석붕 (경상대학교 전자공학과)
  • Published : 2000.06.01
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Abstract

In this paper, we propose the novel test method to detect short and open faults in CMOS Op-amp. The proposed method is composed of two test steps - the offset and the high frequency test. Using HSPICE simulation, we get a 100％ fault coverage. To verify the proposed method, we design and fabricate the CMOS op-amp that contains various short and open faults through Hyundai 0.65$\mu\textrm{m}$ 2-poly 2-metal CMOS process. Experimental results of fabricated chip demonstrate that the proposed test method can detect short and open faults in CMOS Op-amp.

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