Breakdown Voltage and Electrical Characteristics of Organic Thin Film

유기박막의 파괴전압과 전기특성

  • Song, Jin-Won (Dept. of Electrical and Electronic Eng., Dongshin University grad.) ;
  • Kang, Yong-Chul (Dept. of Medical Eng Kwang-Ju Health College) ;
  • Kim, Hyung-Gon (Dept. of Electrical of Chosun Scienstic & Technology College) ;
  • Lee, Woo-Sun (Dept. of Electrical Eng. Chosun University) ;
  • Chung, Hun-Sang (Dept. of Electrical Eng. Chosun University) ;
  • Chang, Hee-Dong (Dept. of Electrical and Electronic Eng. Dongshin University) ;
  • Lee, Kyung-Sup (Dept. of Electrical and Electronic Eng. Dongshin University)
  • 송진원 (동신대학교 대학원 전기전자공학과) ;
  • 강용철 (광주보건대학 의용공학과) ;
  • 김형곤 (조선이공대학 전기과) ;
  • 이우선 (조선대학교 공과대학 전기공학과) ;
  • 정헌상 (조선대학교 공과대학 전기공학과) ;
  • 장희동 (동신대학교 공과대학 전기전자공학부) ;
  • 이경섭 (동신대학교 공과대학 전기전자공학부)
  • Published : 2000.07.17

Abstract

We give pressure stimulation into organic thin films and then manufacture a device under the accumulation condition that the state surface pressure is 30 [mN/m]. LB layers of Arac. acid deposited by LB method were deposited onto y-type silicon wafer as y-type film. In processing of a device manufacture. we can see the process is good from the change of a surface pressure for organic thin films and transfer ratio of area per molecule. The structure of manufactured device is Au/arachidic acid/Al. the number of accumulated layers are 9$\sim$21. Also. we then examined of the MIM device by means of I-V. The I-V characteristic of the device is measured from -3 to +3[V]. The insulation property of a thin film is better as the distance between electrodes is larger.

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