Electrical Characteristics and Models for Asymmetric n-MOSFET′s with Irregular Source/Drain Contacts

불규칙한 소오스/드레인 금속 접촉을 갖는 비대칭 n-MOSFET의 전기적 특성 및 모델

  • 공동욱 (경북대학교 전자전기공학부) ;
  • 정환희 (경북대학교 전자전기공학부) ;
  • 이재성 (위덕대학교 정보통신공학과) ;
  • 이용현 (경북대학교 전자전기공학부)
  • Published : 1999.11.01

Abstract

Abstract - Electrical characteristics or asymmetric n-MOSFET's with different source and drain geometry are experimently investigated using test structures having various gate width. Saturation drain current and resistance in linear region are estimated by a simple schematic model, which consists of conventional device having parasitic resistor. A comparison of experimental results of symmetric and asymmetric devices gives the parasitic resistance caused by abnormal device structure. The suggested model shows good agreement with the measured drain current for both forward- and reverse-modes.

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