Si기판상에 제작된 박막형 백금 측온저항체 온도센서의 특성

Characteristics of Thin-film Type Pt-RTD's Fabricated on Si Wafers

  • 홍석우 (동서대학교 정보통신공학부) ;
  • 노상수 (부산대학교 재료공학부) ;
  • 정귀상 (동서대학교 정보통신공학부)
  • 발행 : 1999.11.01

초록

This paper describes on the electrical and physical charateristics thin-film type Pt-RTD\\`s on Si wafers, in which MgO thin-films were used as medium layer in order to improve adhesion of Pt thin-films to SiO$_2$ layer. The MgO medium layer had the properties of improving Pt adhesion to SiO$_2$ and insulation without chemical reaction to Pt thin-films and the resistivity of Pt thin-films was improved. In the analysis of properties of Pt-RTD, TCR value had 3927 ppm/$^{\circ}C$ and liner in the temperature range of room temperature to 40$0^{\circ}C$

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