RADIATION EFFECT ON METAL CONTAMINATED Si DIODES

• Peng, Y.C. (Department of Materials Science and Engineering, National Tsing Hua Univ,) ;
• Chen, L.J. (Department of Materials Science and Engineering, National Tsing Hua Univ.) ;
• Hsien, W.Y. (United Microelectronics Corporation) ;
• Hsieh, Y.F. (United Microelectronics Corporation) ;
• Lee, C.J. (Dept. of Elect. Eng., Kunsan National Univ.) ;
• Matsuura, T. (Lab. for Electronic Intelligent systems, RIEC Tohoku univ.) ;
• Murota, J. (Lab. for Electronic Intelligent systems, RIEC Tohoku univ.)

• Published : 1998.08.01

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