DEFECT FORMATION MECHNISM OF PROCESS INDUCED TIN-ARC CRACKS

  • Peng, Y.C. (Department of Materials Science and Engineering, National Tsing Hua University) ;
  • Chen, L.J. (Department of Materials Science and Engineering, National Tsing Hua University) ;
  • Hsieh, W.Y. (United Microelectronics Corporation) ;
  • Hsieh, Y.F. (United Microelectronics Corporation)
  • Published : 1998.08.01