Proceedings of the Materials Research Society of Korea Conference (한국재료학회:학술대회논문집)
- 1998.08a
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- Pages.104.3-104
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- 1998
ELECTROMIGRATION STUDY OF Al THIN FILMS DEPOSITED ON LOW DIELECTRIC POLYIMIDE AND $SiO_2$ ILD
- Eun, B.S. (Dept. of Mat. Eng., Hanyang Univ.) ;
- Kim, Y.H. (Dept. of Mat. Eng., Hanyang Univ.)
- Published : 1998.08.01
Abstract
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