Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference (한국전기전자재료학회:학술대회논문집)
- 1998.06a
- /
- Pages.163-166
- /
- 1998
Dielectric Properties and Breakdown Strength in Insulation/Semiconductive/Insulation
절연/반도전/절연층에 있어서 유전특성과 절연파괴 현상
Abstract
In this paper, breakdown strength and dielectric characteristics were experimented in the structures of insulation/insulation/insulation and insulation/semiconductor/insulation by using of insulation material of polyethylene terephthalate film. The breakdown strength and the permitivity of each specimen were measured as a function of temperature and frequency respectively. The breakdown strength of PET/PET/PET did not changed greatly but that of PET/SEMl/PEr increased as a function of temperature. As the frequency inclosed, the permitivity of PET/PET/PET and PET/SEMI/PET decreased. The tan
Keywords