3-dimensional Electric Field Analysis for Field Emission Devices

전계방출소자의 3차원 전계해석

  • Kim, Yeong-Hoon (School of Electrical Engineering, Seoul National University) ;
  • Jung, Jae-Hoon (School of Electrical Engineering, Seoul National University) ;
  • Lee, Byoung-Ho (School of Electrical Engineering, Seoul National University)
  • Published : 1997.11.29

Abstract

3-dimensional finite element method(FEM) electrical field analysis was performed to obtain electric fields on a field emission device tip in an array form. The simulation was performed by applying the Neumann boundary condition to the intermediate plane between tips. To verify our algorithm, comparison between simulation results and experimental data from another paper was made and the difference was discussed. Finally, analysis on triode structure was performed.

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