Fluorinated Silicon Oxide (SiOF) as a New Inter-metal Dielectric

  • Kang, Seung-youl (Semiconductor Technology Division, Electronics and Telecommunications Research Institute) ;
  • Yu, Byung-Gon (Semiconductor Technology Division, Electronics and Telecommunications Research Institute) ;
  • Jang, Won-Ick (Semiconductor Technology Division, Electronics and Telecommunications Research Institute) ;
  • Baek, Jong-Tae (Semiconductor Technology Division, Electronics and Telecommunications Research Institute) ;
  • Yoo, Hyung-Joun (Semiconductor Technology Division, Electronics and Telecommunications Research Institute)
  • 발행 : 1995.06.01