Proceedings of the KIEE Conference (대한전기학회:학술대회논문집)
- 1993.11a
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- Pages.178-180
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- 1993
The Back-Bias Effect on the Breakdown Voltage of SOI Device
Back-bias 효과에 의한 SOI소자의 항복전압 특성.
- Kim, Han-Soo (Department of Electrical Engineering, Seoul National University) ;
- Choi, Yearn-Ik (Department of Electronics Engineering, Ajou University) ;
- Han, Min-Koo (Department of Electrical Engineering, Seoul National University)
- Published : 1993.11.26
Abstract
The back bias effect on the breakdown voltage of SOI
Keywords