Proceedings of the KIEE Conference (대한전기학회:학술대회논문집)

The Korean Institute of Electrical Engineers (대한전기학회)
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Simple Synthetic Testing Facility Using LC Resonance Circuit

LC 공진회로를 이용한 간이 합성시험설비

  • Park, J.H. (Korea Electrotechnology Research Institute) ;
  • Shin, Y.J. (Korea Electrotechnology Research Institute) ;
  • Park, K.Y. (Korea Electrotechnology Research Institute) ;
  • Ryu, H.G. (Korea Electrotechnology Research Institute) ;
  • Kim, M.H. (Korea Electrotechnology Research Institute)
  • 박종화 (한국전기연구소 대전력연구실) ;
  • 신영준 (한국전기연구소 대전력연구실) ;
  • 박경엽 (한국전기연구소 대전력연구실) ;
  • 류형기 (한국전기연구소 대전력연구실) ;
  • 김맹현 (한국전기연구소 대전력연구실)
  • Published : 1993.07.18
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Abstract

This paper shows the procedure to determine the physical variables of the simple synthetic testing facility using LC resonance circuit and presents the calculated results of those variables for the LC resonance circuit which can be used to test circuit breakers up to 36kV 40kA class. Attention has also been paid to the advantages of the LC resonance circuit compared with the method adopting short-circuit generator for the development of circuit breakers.

Keywords