Proceedings of the KIEE Conference (대한전기학회:학술대회논문집)
- 1989.07a
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- Pages.380-382
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- 1989
Dependence of Dielectric breakdown of Thin Poly (Vinylidene Fluoride) Film on Temperature
Poly (Vinylidene Fluoride) 박막의 절연파괴와 온도의존성
- Kim, Dong-Wook (GOLD STAR CABLE CO. R&D LAB.) ;
- Park, Dae-Hee (GOLD STAR CABLE CO. R&D LAB.)
- Published : 1989.07.21
Abstract
Dielectric breakdown strength (Eb) of thin Poly(Vinylidene Fluoride ; PVDF) film is studied in the temperature range between 4.2 K and 400 K. The results of this study can be summerized as follows. 1) Temperature dependence of dielectric breakdown strength (Eb) can be devided into high and low temperature regions. The critical temperature (Tc) at which two regions are devided depends on applied voltage. 2) Dielectric breakdown strength (Eb) by pulse voltage is higher than that by DC voltage. Especially this difference is remarkable at low temperature.
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