• 제목/요약/키워드: x-ray diffraction

검색결과 6,816건 처리시간 0.034초

고온에서 발생한 코크스-미연소탄-소결광의 혼합물 중 미연소탄의 정량화를 위한 분말 X-선 회절법 적용 (Application of Quantitative X-ray Diffraction Analysis for Unburned Coal Content on Coke-Char-Sinter Mixtures)

  • 김재명;정진경;김성만;허완욱;김형순
    • 한국세라믹학회지
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    • 제40권5호
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    • pp.481-487
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    • 2003
  • 고로 연소대의 거동에서 석탄, 미연소탄, 코크스의 함량을 측정할 수 있는 분석기술이 필요하다 탄소질 재료에 분말 X-선 회절 정량법을 적용하여 석탄, 미연소탄, 코크스의 혼합시료에 대하여 탄소의 함량을 정량적으로 파악할 수 있는 방법을 연구하였다. 분석을 위하여 석탄을 1000~140$0^{\circ}C$의 온도에서 시간을 달리하여 미연소탄을 제조하여 XRD를 이용하여 분석하였다. 또한, XRD 분석을 위해 제조된 시료에 대하여 HCI과 HF용액을 이용하여 시료 내에 포함된 광물성분을 제거하였다. XRD측정 결과로부터 결정 층의 두께(L $c_{(002)}$)와 결정 층의 크기(L $a_{(10)}$), 방향족분율, 흑연화도, 면간거리( $d_{0.2}$), 탄소 층의 수( $N_{ι}$)를 측정하였다. 그 결과로 열처리 온도가 증가됨에 따라 L $c_{(002)}$, L $a_{(10)}$, 흑연화도는 증가하였으며, 면간거리와 반가폭은 감소하였다. 따라서 미연소탄-코크스 혼합물에 대한 결정층의 두께자료는 합성시료로부터 미연소탄의 함량을 정량화할 수 있었다.

사파이어 웨이퍼 연마공정에서의 표면처리효과에 대한 X-선 회절분석 (X-ray diffraction analysis on sapphire wafers with surface treatments in chemical-mechanical polishing process)

  • 김근주;고재천
    • 한국결정성장학회지
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    • 제11권5호
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    • pp.218-223
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    • 2001
  • 수평 Bridgman 방법으로 성장한 사파이어 인고트를 절단 연마한 후, 사파이어 결정기판의 표면을 우레탄 천 위에서 실리카 졸을 사용하여 폴리싱하였다. 표면의 결정성을 X-선 회절을 통하여 조사하였으며, 2중 결정회절에 의한 반치폭은 200~400 arcsec을 가지며, 결정 인고트의 절편화 또는 양면 연삭 연마에 따른 잔류응력에 의한 표면에서의 기계적인 스트레스에 의해 결정성이 손상되어진다. 화학-기계적인 폴리싱공정을 수행한 수에 표면처리로 $1,200^{\circ}C$로 4시간 열처리 및 산처리를 연속적으로 수행할 경우 결정성이 반치폭 8.3 arcsec까지 줄어들어 향상됨을 확인하였다.

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X-선 회절분석법에 의한 $Ba(Zn_{1/3}Ta_{2/3})O_3$의 격자 비틀림 측정 (The Analysis of Lattice Distortion of $Ba(Zn_{1/3}Ta_{2/3})O_3$ by X-ray Diffraction)

  • 김정돈;김인태;제해준
    • 분석과학
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    • 제5권1호
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    • pp.111-114
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    • 1992
  • $Ba(Zn_{1/3}Ta_{2/3})O_3$는 고온에서 열처리시 Zn과 Ta 이온이 ordering을 일으키며 이때 격자 비틀림이 일어난다. 본 실험에서는 이러한 격자비틀림을 X-선 분말회절법을 사용하여 1/10,000 이상의 정밀도로 측정하였으며, 그 결과 $Ba(Zn_{1/3}Ta_{2/3})O_3$$1350^{\circ}C$ 30분 소결시에도 상당한 정도의 격자 비틀림이 발생하며 이러한 격자비틀림은 소결시간이 길어질수록 증가함을 관찰하였다.

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InxGa1-xN/GaN 박막의 광학적 특성 (Optical properties of InxGa1-xN/GaN epilayers)

  • 전용기;정상조
    • 한국재료학회지
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    • 제12권1호
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    • pp.54-57
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    • 2002
  • We have grown undoped $In_ xGa_{1-x}N,\; In_xGa_{1-x}N:Si\;and\;In_{0.1}Ga_{0.9}N:Zn$ thin films by MOCVD at temperature between 880 and $710^{\circ}C which endows various In composition in the epilayer from 0.07 to 0.22 as examined using X-ray diffraction, optical absorption(OA), photocurrent (PC) and photoluminescence (PL). The In molar fraction estimated from PL results is higher than that from the OA, PC, and X-ray data for $X{\le}0.22$, which may be caused by phase separation. However, the In molar fraction estimated by X-ray diffraction, OA, PC and PL for $In_xGa_{1-x}N:Si$ does not show discrepancy. With the appropriate Zn doping in undoped $In_{0.1}Ga_{0.9}N$, the emission peak is shifted from 3.15 eV which originates from the band edge emission peak to 2.65 eV which resulted from the conduction band to acceptor transition due to a deep acceptor level.

Real-time X-ray Scattering as a Nanostructure Probe for Organic Photovoltaic Thin Films

  • 이현휘;김효정;김장주
    • 한국진공학회:학술대회논문집
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    • 한국진공학회 2013년도 제44회 동계 정기학술대회 초록집
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    • pp.181-181
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    • 2013
  • Recently, nanostructure and the molecular orientation of organic thin films have been largely paid attention due to its importance in organic electronics such as organic thin film transistors (OTFTs), organic light emitting diodes (OLEDs), and organic photovoltaics (OPVs). Among various methods, the diffraction and scattering techniques based on synchrotron x-rays have shown powerful results in organic thin film systems. In this work, we introduce the in-situ annealing system installed at PLS-II (Pohang Light Source II) for organic thin films by simultaneously conducting various x-ray scattering measurements of x-ray reflectivity, conventional x-ray scattering, grazing incidence wide angle x-ray scattering (GI-WAXS) and so on. Using the in-situ measurement, we could obtain real time variation of nanostructure as well as molecular orientation during thermal annealing in metal-phthalocyanine thin films. The variation of surface and interface also could be simultaneously investigated by the x-ray reflectivity measurement.

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Prediction of Fatigue Life in 2024-73 Aluminum Using X-ray half-value breadth

  • Kim, Soon-Ho;Cho, Seok-Swoo;Park, Jung-Hyeon
    • International Journal of Precision Engineering and Manufacturing
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    • 제3권2호
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    • pp.78-86
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    • 2002
  • In general, X-ray diffraction method detects the changes of crystal lattice under material surface using the angle of diffraction 2$\theta$. This technique which deals with in the presented paper can be applied to a behavior on the slipped band or the micro crack cause to material degradation. The relation between half-value breadth and cycle numbers shows three stages, which consist of rapid decrease in the initial cycle, slight decrease in the middle cycle, and then rapid decrease in the final cycle. The ratio of half-value breadth has a constant value on B/B$\_$0/ - N diagram under the loading condition except early part of fatigue life. The ratio of half-value breadth B/B$\_$0/ - log N$\_$f/ with respect to number of cycle to failure N$\_$f/ has linear behavior on B/B$\_$0/ - log N$\_$f/ diagram. Therefore, the evaluation of fatigue life by the average gradient has much less mean error than the estimation of fatigue life by log B/B$\_$0/ - log N/N$\_$f/ relation.

Synthesis, Structure, and Thermal Property of Poly(trimethylene terephthalate- co-trimethylene 2,6-naphthalate) Copolymers

  • Jeong, Young-Gyu;Jo, Won-Ho;Lee, Sang-Cheol
    • Fibers and Polymers
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    • 제5권3호
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    • pp.245-251
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    • 2004
  • Poly(trimethylene terephthalate-co-trimethylene 2,6-naphthalate)s (P(TT-co-TN)s) with various copolymer composition were synthesized, and their chain structure, thermal property and crystalline structure were investigated by using $^1$H-NMR spectroscopy, differential scanning calorimetry (DSC) and wide-angle X-ray diffraction (WAXD), respectively. It was found from sequence analysis that all the P(TT-co-TN) copolymers synthesized have a statistical random distribution of TT and TN units. It was also observed from DSC thermograms that the glass transition temperature increases linearly with increasing the TN comonomer content, whereas the melting temperature of copolymer decreases with increasing the corresponding comonomer content in respective PTT- and PTN-based copolymer, showing pseudo-eutectic melting behavior. All the samples melt-crystallized isothermally except for P(TT-co-66 mol % TN) exhibit multiple melting endotherms and clear X-ray diffraction patterns. The multiple melting behavior originates from the dual lamellar population and/or the melting-recrystallization-remelting. The X-ray diffraction patterns are largely divided into two classes depending on the copolymer composition, i.e., PTT and PTN $\beta$-form diffraction patterns, without exhibiting cocrystallization.

Structure of Ni and NiO Nanoparticles Observed by X-ray Coherent Diffraction Imaging

  • Kim, Chan;Kim, Yoon-Hee;Hamh, Sun-Young;Son, Jun-Gon;Khakurel, Krishna Prasad;Iqbal, Mazhar;Noh, Do-Young
    • 한국진공학회:학술대회논문집
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    • 한국진공학회 2012년도 제42회 동계 정기 학술대회 초록집
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    • pp.542-543
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    • 2012
  • Coherent diffraction imaging (CDI) method using hard x-ray at 5.46 keV was applied to study assembly of Ni and Ni oxide nano structures formed on a Si3N4 membrane. Density distribution of Ni nano-particles was obtained quantitatively with about 15 nm lateral resolution by reconstructing images from the speckle diffraction pattern. In addition, reconstructed images of nickel oxide particles indicated that Ni atoms diffuse out during the oxidation process leaving pores inside the nickel oxide crust. Furthermore, we recognize that really weak phase object, less than 5 nm thickness of Ni residues, can be reconstructed due to the reference particles. We achieved quantitative information of nanometer sized materials and demonstrate the effect of reference particles by using hard x-ray coherent diffractive imaging method.

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Ag가 첨가된 0.9(Na0.52K0.48)NbO3-0.1LiTaO3 세라믹스 (Characterization of Ag doped 0.9(Na0.52K0.48)NbO3-0.1LiTaO3 Ceramics)

  • 이경수;고중혁
    • 한국전기전자재료학회논문지
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    • 제23권7호
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    • pp.517-520
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    • 2010
  • Lead-free $0.9(Na_{0.52}K_{0.48})NbO_3$ - $0.1LiTaO_3$ piezoelectric ceramics doped with $Ag_2O$ (0-4 mol%) have been prepared by the conventional mixed oxide method. The structural and electrical properties were analyzed in order to find its potential applications. The crystal structure of 1-4 mol% Ag doped $0.9(Na_{0.52}K_{0.48})NbO_3$-$0.1LiTaO_3$ lead free piezoelectric ceramics were investigated for several sintering temperatures ($1100^{\circ}C$) by the use of X-ray diffraction analysis. In order to analyze the effect of Ag dopants on the $0.9(Na_{0.52}K_{0.48})NbO_3$-$0.1LiTaO_3$ ceramic, the diffraction intensity ratio of the (002) to (200) planes were calculated from the X-ray diffraction patterns of the ceramic samples.

코로나 처리를 이용한 신발용 나일론 직물의 접착력 향상 (Improvement of Adhesion of Footwear Nylon Fabric by Corona Treatment)

  • 이재호
    • 접착 및 계면
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    • 제7권3호
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    • pp.26-33
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    • 2006
  • 나일론 직물들이 전류세기 5, 10, 15, 20 A, 공급속도 5, 10, 15 m/min로 코로나 처리되었다. 나일론 직물의 표면변화를 X-ray 회절장치, 주사전자현미경(SEM)과 X-ray 광전자분석기(ESCALAB)로 확인하였다. 또한 물리적 성질의 변화를 인장 인열강도, 접착 및 습윤강도를 통하여 측정하였다. 접착에 사용된 접착제는 열경화성 반응형 폴리우레탄 핫 멜트 접착제이다. 대기압에서 코로나 방전처리에 의해 나일론 직물에 관능기들이 도입되어졌고, 그 결과 접착력은 향상되었다. 코로나 처리된 나일론 직물의 접착강도는 전류 세기가 증가할수록, 공급속도가 감소할수록 증가하였다.

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