• 한국정밀공학회:학술대회논문집
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• 한국정밀공학회 1997년도 춘계학술대회 논문집
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• pp.61-67
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• 1997

The electronic speckle pattern interferometer (ESPI) has been applied to many technical problems such as deformation and displacement measurement, strain visualization and surface roughness monitoring. In this study, we used an ESPI system based on the dual beam speckle interferometer method in order to measure in-plane displacement and vibration mode using the ESIP technique. This research was carried out for the purpose of applying the vibration analysis method employing Electro-Optic holographic interference technique to the vibration analysis of uniform rectangular cantilevers plate(SS400,STS304) with cantilevers span to breadth ratio of 150 by 75. And thickness of 1mm and 0.8mm respectively. We improved the ESPI technique in order to obtain the distribution of displacement component resolved in one direction through a CCD camera combined with an image processing system. To certify and to assess the accuracy in measuring by this ESPI, the results obtained with the speckle method and vibration mode analysis are to be compared with those results by Warbuton's Theoretical expression and vibration made in FEM analysis.