• Journal of the Korean Data and Information Science Society
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• v.8 no.2
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• pp.211-223
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• 1997

We introduce the linear estimators based on order statistics in the three-parameter Weibull distribution and compare the small sample performances of proposed linear estimators in the three- parameter Weibull distribution with an unidentified outlier.

• Journal of the Korean Data and Information Science Society
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• v.4
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• pp.131-136
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• 1993

We shall consider the trends of correlation coefficient between the smallest and largest observations in the Weibull model in the presence of an unidentified outlier, and derive the density functions of order statistics by the permanent theory.

• Journal of Korean Society for Quality Management
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• v.16 no.2
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• pp.56-67
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• 1988

It is wellknown that the left truncated exponential distribution with positivity constraint on the location parameter is appropriate as a lifetime distribution model, In this paper, some Bayes estimators of the parameters and reliability for the left truncated exponential lifetime distribution when an unidentified-failure outlier is included and it is excluded in the exchangeable outlier model are proposed, and the performances of these proposed Bayes estimators are also discussed.

• Journal of the Korean Data and Information Science Society
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• v.18 no.2
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• pp.507-514
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• 2007

We shall propose several estimators for the scale parameter in the Pareto distribution with an unidentified exponential outlier when the scale parameter is functions of a known exposure level, and obtain expectations and variances for their proposed estimators. And we shall compare numerically efficiencies for proposed estimators of the scale and shape parameters in the small sample sizes.

• Journal of the Korean Data and Information Science Society
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• v.17 no.3
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• pp.1021-1028
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• 2006

We shall propose ML, ordinary jackknife and biased reducing estimators of the parameter in the right truncated exponential distribution with an unidentified uniform outlier when the truncated point is unknown and their biases and MSE's are compared numerically each other in the small sample sizes.

• Journal of the Korean Data and Information Science Society
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• v.6 no.1
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• pp.85-96
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• 1995

The purpose of this paper is to propose the kernel density estimator and the jackknife kernel density estimator in the presence of k's unidentified outliers, and to compare the small sample performances of the proposed estimators in a sense of mean integrated square error(MISE).

• Communications for Statistical Applications and Methods
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• v.5 no.3
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• pp.837-845
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• 1998

We shall propose several estimators and confidence intervals for the scale parameter in a uniform distribution with the presence of a unidentified outlier and obtain biases and mean squared errors for their proposed estimators. And we shall numerically compare the performances for the proposed several estimators of the sclae parameter. Also, we shall compare lengths of confidence intervals of the scale parameter in a uniform distribution through Monte Carlo methods.

• The Transactions of the Korea Information Processing Society
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• v.5 no.10
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• pp.2575-2583
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• 1998

The productionof the highly relible softwae systems and theirs performance evaluation hae become important interests in the software industry. The software evaluation has been mainly carried out in ternns of both reliability and performance of software system. Software reliability is the probability that no software error occurs for a fixed time interval during software testing phase. These theoretical software reliability models are sometimes unsuitable for the practical testing phase in which a software error at a certain testing stage occurs by causes of the imperfect debugging, abnornal software correction, and so on. Such a certatin software testing stage needs to be considered as an outlying stage. And we can assume that the software reliability does not improve by means of muisance factor in this outlying testing stage. In this paper, we discuss Bavesian software reliability growth modeling and estimation procedure in the presence of an imidentitied outlying software testing stage by the modification of Jehnski Moranda. Also we derive the Bayes estimaters of the software reliability panmeters by the assumption of prior information under the squared error los function. In addition, we evaluate the proposed software reliability growth model with an unidentified outlying stage in an exchangeable model according to the values of nuisance paramether using the accuracy, bias, trend, noise metries as the quantilative evaluation criteria through the compater simulation.