• Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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• 2003.07b
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• pp.1143-1146
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• 2003

This paper was simulated the electric field distribution in dielectric tube with two layers and spherical dielectric in water. The reactor was made up of the spherical dielectric that is diameter : 2.5[mm], ${\epsilon}_r$ : 5, 25, 100, 1000, 5000 respectively and two glass plate being 2[mm] thickness, ${\epsilon}_r$ : 5 as electrode. The discharge gap was 9[mm]. As a result of the simulation, in case of being about the same value between the dielectric constant of spherical dielectric and water, when the reactor was applied to high voltage, dielectric polarization characteristic was trending toward disappearance. To get more strong electric field, the dielectric constant should be higher comparatively, Increasing the spherical dielectric constant, the location of equippotential line was shifting from the interior to the exterior.

• Interaction and multiscale mechanics
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• v.3 no.2
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• pp.157-171
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• 2010

In this paper, a theoretical method has been developed for the electric double layer interaction under condition of the variable dielectric permittivity of water. Using Poisson-Boltzmann equation (PBE), for one plate and two plates having similar or dissimilar constant charge or constant potential, we have investigated the electric double layer potential, its gradient and the disjoining pressure as well as the effect of variation of dielectric permittivity on these parameters. It has been assumed that plates are separated by a specific distance and contain a liquid solution in between. It is shown that reduction of the dielectric permittivity near the interfaces results in compression of electric double layers and affects the potential and its gradient which leads to a decreased electrostatic repulsion. In addition, it is shown that variation of dielectric permittivity in the case of higher electrolyte concentration, leads to a greater change in potential distribution between two plates.

• The Journal of the Institute of Internet, Broadcasting and Communication
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• v.16 no.2
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• pp.87-92
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• 2016

In this paper, the solutions of TE(transverse electric) scattering problems by a conductive strip grating over two dielectric layers are analyzed by applying the PMM(point matching method) known as a numerical method of electromagnetic field. The boundary conditions are applied to obtain the unknown field coefficients, the scattered electromagnetic fields are expanded in a series of Floquet mode functions, and the conductive boundary condition apply to analysis of conducting strip. The most normalized reflected and transmitted powers having a sharp variations are scattered in direction of the other angles except incident angle. The numerical results for the normalized reflected and transmitted powers are analyzed by according as the width and spacing of conductive strip, incident angles, and the relative permittivity and thickness of the two dielectric layers. To confirm the validity of this paper, the numerical results of presented structure are shown in good agreement compared to those of the existing papers.

• Journal of Advanced Navigation Technology
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• v.18 no.1
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• pp.78-83
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• 2014

In this paper, the solutions of TM (transverse magnetic) scattering problems by perfectly conducting strip grating on two dielectric layers are analyzed by applying the FGMM (Fourier Galerkin moment method) as a numerical method. For the TM scattering problem, the induced surface current density is expected to the very high value at both edges of the strip, then the induced surface current density on the strip is expanded in a series of the multiplication of the functions of appropriate edge boundary condition and the Chebyshev polynomials of the first kind. The numerical results are obtained for the magnitude of induced current density, the normalized reflected power and transmitted power. The numerical results using proposed functions were improved the convergence faster than existing exponential functions, and the numerical results shown the good agreement compared to those of the existing papers.

• Journal of Information Display
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• v.2 no.3
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• pp.39-43
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• 2001

The glass compositions of $PbO-SiO_2-B_2O_3$ system and $P_2O_5-PbO-ZnO$ system for the transparent dielectric materials for front panel and $P_2O_5$-ZnO-BaO and $SiO_2-ZnO-B_2O_3$ for the reflective dielectric materials for back panel of PDP (Plasma Display Panel) were investigated. As a result, transparent dielectric materials for front panel showed good dielectric properties, high transparency, and proper thermal expansion matching to soda lime glass substrate. And the reflective dielectric layers for back panel were prepared from two series of parent glass and oxide filler. It was found that these glassceramics are useful materials for dielectric layers in PDP device, as they have similar thermal expansion to soda-lime glass plate, high reflectance, and low sintering temperature. In particular, the addition of $BPO_4$ and $TiO_2$ as fillers to $SiO_2-ZnO-B_2O_3$ system is considered to be the most effective for acquiring good properties of lower dielectric layer for PDP device.

• Proceedings of the KIEE Conference
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• 1997.11a
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• pp.391-393
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• 1997

Two kinds of the calculation technique are Investigated with 3D triangular SCM for the arrangement of the dielectric sphere with different resistivity under a uniform electric field. The calculation error of Method I is small outside the sphere, but considerably high Inside. On the other hand, the accuracy is much Improved even Inside the solid dielectric by Method II, which uses double layers of triangular charges on the dielectric boundary.

• Korean Journal of Optics and Photonics
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• v.7 no.1
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• pp.17-23
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• 1996

At oblique angles of incidence, polarization properties of metal layers and dielectric layers are investgated and we designed the optical thin film systems reducing the variation of the polarization state, for target reflectances 0.5 and 0.6 at $45^{\circ}$ incidence in broad band wavelength regions $(\DELTA\lambda/\lambda= 10%)$ using two dielectric matching layers and one metal layer.

• Proceedings of the Korean Vacuum Society Conference
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• 2012.02a
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• pp.127-127
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• 2012

We carried out the high-resolution dielectric mapping of graphenes on $SiO_2$/Si substrate, using the scattering Apertureless Near-Field Scanning Optical Microscopy (s-ANSOM) in both visible (633 nm) and infrared (3.6 um) wavelengths. In the visible wavelength, the dielectric contrasts are almost proportional to the number of the graphene layers, which indicates that the near-field interaction between the tip and individual graphene layers leads to an image charge oscillation in two-dimension. In the infrared region, on the other hand, we observe unique layer-specific contrasts that do not linearly increase with number of layers. It is attributed to the layer-dependent band- structure of graphenes.

• Proceedings of the Optical Society of Korea Conference
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• 1990.02a
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• pp.87-90
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• 1990

We compare the reflectivity spectrum and phase change of Bragg reflectors obtained by the matrix method and the coupled wave method. We show that the results obtained by the two methods agree well generally and the discrepancy between the results obtained by the two methods increases as the fractional refractive index difference between adjacent layers increases and/or the absorption loss increases, due to the approximations inherent in the coupled wave method for the analysis of multiple dielectric layers.

• The Journal of the Institute of Internet, Broadcasting and Communication
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• v.15 no.2
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• pp.65-70
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• 2015

In this paper, the solutions of TE (transverse electric) scattering problems by a conductive strip grating over grounded two dielectric layers are analyzed by applying the PMM (point matching method) known as a numerical method of electromagnetic fileld. The boundary conditions are applied to obtain the unknown field coefficients, the scattered electromagnetic fields are expanded in a series of Floquet mode functions, and the conductive boundary condition apply to analysis of conducting strip. The most normalized reflected powers of the sharp variations in minimum values are scattered in direction of the other angles except incident angle. The numerical results for normalized reflected power are analyzed by according as the width and spacing of conductive strip, the relative permittivity and thickness of the two dielectric layers, and incident angles. The numerical results of present numericl analysis are shown in good agreement compared to those of the existing papers using FGMM (fourier galerkin moment method).