• Journal of Korea Foundry Society
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• v.21 no.3
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• pp.187-191
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• 2001

가스분무장치를 이용하여 제조된 304 stainless steel 분말의 미세응고조직 특성을 투과전자현미경으로 관찰하였다. 분말이 sandwich 현상으로 존재하도록 구리로 전기도금한 후 tripod jig 를 이용하여 기계적 연마하여 TEM 시편을 제작하였다. 이 방법으로 제조된 TEM 시편은 넓은 지역에서 200KV 로 가속된 전자가 투과하기에 충분히 얇았으며, 작은 분말의 경우에는 분말 전체를 관찰할 수 있었다. 제한시야회절법(SADP)을 이용하여 100 ${\mu}m$ 이하 분말의 결정구조를 조사한 결과에 따르면 가스분무법으로 급냉응고된 대부분의 분말은 austenite 상으로 응고되었으며, 모든 austenite 분말은 크기에 관계없이 쌍정조직 (twinstructure)이 발견되었으며 그 밀도 역시 아주 높았다. 그러나 직경이 2 ${\mu}m$ 이하의 분말에서는 큰 과냉 (supercooling) 효과에 의하여 준결정상인 bcc 상으로 응고됨을 발견하였다.

• Progress in Superconductivity and Cryogenics
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• v.8 no.1
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• pp.9-14
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• 2006

Sample preparation plays a critical role in microstructure analysis using TEM. Although TEM specimen has been usually prepared by jet-polishing or Ar-ion beam milling technique. these methods could not be applied to YBCO CC which is composed of IBAD or RABiTS substrates, several buffet layers, and YBCO superconducting layer because of big difference in mechanical strengths between the metallic phase and oxide phases. To obtain useful cross-sectional information such as interface between the phases or second phases in YBCO CC, it is prerequisite to secure the large area of thin section in the cross-sectional direction. The superconducting layer or the buffer layers are relatively weak and fragile compared to the metallic substrate such as Ni-5wt%W RABiTS of Hastelloy-based IBAD, and preferential removal of weak ceramic phases during polishing steps makes specimen preparation almost impossible. Tripod polisher and small jig were home-made and employed to sample preparation. The polishing angle was maintained <$1^{\circ}$ throughout the polishing steps using 2 micrometers attached to the tripod plate. TEM specimens with large and thin area could be secured and used for RABiTS/IBAD substrate analyses. In some cases, additional Ar-beam ion milling with low beam current and impinging angle was used for less than 30 sec. to remove debris or polishing media attacked to the specimens.