• 제목/요약/키워드: technology lifetime

검색결과 937건 처리시간 0.025초

81미리 조명탄용 신관 KM84A1E1 지연제의 저장수명 예측 연구 (A Study of Storage Life Estimation for Delay System in the Fuse of 81mm Illuminating Projectile)

  • 장일호;김지훈;이우철;백승준;손영갑
    • 품질경영학회지
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    • 제40권3호
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    • pp.270-277
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    • 2012
  • Purpose: In this paper, storage lifetime of delay system in the fuse of 81MM illuminating projectile is estimated. Methods: Accelerated degradation testings of tungsten delay system using both temperature and humidity stresses were performed, and then delay time increase of the systems were analyzed as degradation data based on distribution-based degradation processes. Results: The estimated storage lifetime of detonator is between 11.8 years and 17.6 years with each stress-life relationship. Conclusion: Comparing with field data, storage lifetime of 90% reliability is about 12 years.

갈바륨 강판의 특성에 관한 연구 (A Study on the Characteristics of Gavalume Steel Sheet)

  • 김순경
    • 한국생산제조학회지
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    • 제7권2호
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    • pp.74-80
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    • 1998
  • An extensive corrosion study was initiated by galvalume steel sheet manufacturing company to clarify the corrosion behavior of zinc and zinc-alloy coated automotive sheet steel in out panel and electrical application. Since the early 1980's the use of zinc and aluminum alloy coated steel for vehicular corrosion protection has increased drastically. This paper describes the evaluation of formability, weldability and painted corrosion performance of galvalume steel sheet. This paper presents an overview of the program and some initial test results on the weldability, lifetime of the electrode tip shape of the spot welding and corrosion protection. Galvalume steel sheet improved corrosion performance and spot weldability of galvalume steel sheet has no problem for the variation of welding current. And tip lifetime was changed according to the influence of shape.

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Improving Energy Efficiency and Lifetime of Phase Change Memory using Delta Value Indicator

  • Choi, Ju Hee;Kwak, Jong Wook
    • JSTS:Journal of Semiconductor Technology and Science
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    • 제16권3호
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    • pp.330-338
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    • 2016
  • Phase change memory (PCM) has been studied as an emerging memory technology for last-level cache (LLC) due to its extremely low leakage. However, it consumes high levels of energy in updating cells and its write endurance is limited. To relieve the write pressure of LLC, we propose a delta value indicator (DVI) by employing a small cache which stores the difference between the value currently stored and the value newly loaded. Since the write energy consumption of the small cache is less than the LLC, the energy consumption is reduced by access to the small cache instead of the LLC. In addition, the lifetime of the LLC is further extended because the number of write accesses to the LLC is decreased. To this end, a delta value indicator and controlling circuits are inserted into the LLC. The simulation results show a 26.8% saving of dynamic energy consumption and a 31.7% lifetime extension compared to a state-of-the-art scheme for PCM.

릴레이 네트워크에서의 협업전송 프로토콜 (Cooperative transmission protocol in the relay network)

  • 고상;박형근
    • 한국정보통신학회:학술대회논문집
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    • 한국해양정보통신학회 2009년도 추계학술대회
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    • pp.1046-1048
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    • 2009
  • 협업통신은 다중경로페이딩의 문제를 해결하고 전송전력소모를 감소시키기위한 효과적인 기술이다. 릴레이선택과 전력할당은 협업통신의 성능을 결정하는 중요한 요소이다. 본 논문에서는 센서네트워크에서 네트워크수명 극대화를 위해 새로운 형태의 다중 릴레이선택 방법과 전력할당 알고리즘을 제안한다. 제안하는 릴레이 선택 알고리즘은 채널상태 뿐아니라 각 노드의 잔여전력을 함께 고려함으로써 전송전력을 극소화하고 네트워크의 수명을 증가시킨다. 시뮬레이션결과는 제안된 알고리즘이 기존의 방식에비해 더 긴 네트워크 수명을 갖을 수 있음을 보여준다.

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A HYPOTHESIS TESTING PROCEDURE OF ASSESSMENT FOR THE LIFETIME PERFORMANCE INDEX UNDER A GENERAL CLASS OF INVERSE EXPONENTIATED DISTRIBUTIONS WITH PROGRESSIVE TYPE I INTERVAL CENSORING

  • KAYAL, TANMAY;TRIPATHI, YOGESH MANI;WU, SHU-FEI
    • Journal of applied mathematics & informatics
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    • 제37권1_2호
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    • pp.105-121
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    • 2019
  • One of the main objective of manufacturing industries is to assess the capability performance of different processes. In this paper, we use the lifetime performance index $C_L$ as a criterion to measure larger-the-better type quality characteristic for evaluating the product performance. The lifetimes of products are assumed to follow a general class of inverted exponentiated distributions. We use maximum likelihood estimator to estimate the lifetime performance index under the assumption that data are progressive type I interval censored. We also obtain asymptotic distribution of this estimator. Based on this estimator, a new hypothesis testing procedure is developed with respect to a given lower specification limit. Finally, two numerical examples are discussed in support of the proposed testing procedure.

Lifetime of Insoluble Anode for Cathodic Protection on Concrete Construction

  • Sohn, Kicheon;Chang, Hyunyoung;Kim, Youngsik
    • Corrosion Science and Technology
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    • 제4권2호
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    • pp.56-59
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    • 2005
  • In rebar concrete structure, the corrosion of rebar can arise the deterioration of concrete structure and may affect the safety of the whole system. Recently, several methods for corrosion protection have been used and are more important for concrete structure using the sand including chloride ion. Among several protections, electrical cathodic protection has been expected to be one of the most useful methods in corrosion protection for reinforcement of concrete structures. The anode for cathodic protection needs high current density, high corrosion resistance and low overvoltage. To fill up the special qualities, the insoluble anodes were developed and these anodes were coated with metal oxide of $TiO_2$, $ZrO_2$, $RuO_2$, and $IrO_2$. Lifetime of these anodes can be one of the important factors affecting the lifetime of concrete structure in cathodic protection. In this work, several anodes were made by sol-gel method and thermal decomposition method and the lifetime of these anodes was evaluated by NACE international standard test method, TM 0294-94. Also, we did analyze the properties of coated metal oxides.

Effect of Ambient Temperature on Insulation Lifetime of Winding Coil Prepared with Polyamideimide/Nanosilica Enamelled Wire

  • Park, Jae-Jun;Woo, Myung-Ha;Lee, Jae-Young;Hwang, Don-Ha
    • Transactions on Electrical and Electronic Materials
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    • 제17권5호
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    • pp.297-301
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    • 2016
  • The effects of ambient temperature and diameter on the insulation lifetime of winding coils prepared with polyamideimide (PAI), flexural PAI (nanosilica 5 wt%) and anti-corona PAI (nanosilica 15 wt%) wires were investigated. The winding coils were made of enameled wire with enamel thickness of 30~50 μm. The thickness and width of the rectangular copper wires were 0.77~0.83 mm and 1.17~1.23 mm, respectively. The insulation breakdown lifetime decreased with increasing ambient temperature regardless of wire type and winding coil diameter under an inverter surge of 1.5 kV/20 kHz. The insulation breakdown lifetimes of φ5 mm winding coils at 150, 200, and 250℃ were 11.38, 5.19, and 4.22 min respectively, and those of φ10 mm winding coils at 150, 200, and 250℃ were 11.32, 5.79, and 4.57min respectively. The winding coil diameter had little effect on the insulation lifetime.

PROLONGATION OF THE BOR-60 REACTOR OPERATION

  • IZHUTOV, ALEXEY L.;KRASHENINNIKOV, YURI M.;ZHEMKOV, IGOR Y.;VARIVTSEV, ARTEM V.;NABOISHCHIKOV, YURI V.;NEUSTROEV, VICTOR S.;SHAMARDIN, VALENTIN K.
    • Nuclear Engineering and Technology
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    • 제47권3호
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    • pp.253-259
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    • 2015
  • The fast neutron reactor BOR-60 is one of the key experimental facilities worldwide to perform large-scale tests of fuel, absorbing, and structural materials for advanced reactors. The BOR-60 reactor was put into operation in December 1969, and by the end of 2014 it had been operating on power for ~265,000 hours. BOR-60 still demonstrates potential capabilities to extend the lifetime of sodium-cooled fast reactors. The BOR-60 lifetime should have expired at the end of 2014. Over the past few years, a great scope of work has been performed to justify the possibility of extending its lifetime. The work included inspection of the equipment conditions, calculations and experimental research on operating parameters and the conditions of nonremovable components, investigation of the structural material samples after their long-term operation under irradiation, etc. Based on the results of the work performed, the residual lifetime was evaluated and the reactor operator made a decision to extend the lifetime period of the BOR-60 reactor. After considering both a set of documents about the reactor conditions and the positive decision of independent experts, the Regulatory Authority of the Russian Federation extended the BOR-60 operating license up to 2020.

Rapid Synthesis of AgInS2/ZnS Core/Shell Nanoparticles and Their Luminescence Property

  • Lee, Seung Jae;Kim, Da Hea;Jung, Jongjin;Park, Joung Kyu
    • Rapid Communication in Photoscience
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    • 제4권2호
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    • pp.45-47
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    • 2015
  • We have successfully synthesized $AgInS_2$ core and $AgInS_2$/ZnS core/shell nanoparticles by the sonochemical method. The ultrasonic based $AgInS_2$ and $AgInS_2$/ZnS nanoparticle synthesis can be utilized as a simple and rapid method. The $AgInS_2$/ZnS nanoparticles show the higher fluorescence intensity and quantum yield than $AgInS_2$ nanoparticles. Fluorescence wavelength of $AgInS_2$/ZnS shows blue shift from 635 nm to 610 nm against $AgInS_2$ because of reducing the defect sites and increasing spatial confinements. For the fluorescence lifetime, $AgInS_2$/ZnS (124.8 ns) has longer lifetime than $AgInS_2$ (54.8 ns).

플립칩의 설계변수 변화에 따른 보드레벨 플립칩에서의 낙하충격 수명예측 (Prediction of the Impact Lifetime for Board-Leveled Flip Chips by Changing the Design Parameters of the Solder Balls)

  • 이수진;김성걸
    • 한국생산제조학회지
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    • 제24권1호
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    • pp.117-123
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    • 2015
  • The need for drop simulations for board-leveled flip chips in micro-system packaging has been increasing. There have been many studies on flip chips with various solder ball compositions. However, studies on flip chips with Sn-1.0Ag-0.5Cu and Sn-3.0Ag-0.5Cu have rarely been attempted because of the unknown material properties. According to recent studies, drop simulations with these solder ball compositions have proven feasible. In this study, predictions of the impact lifetime by drop simulations are performed considering Cu and Cu/Ni UBMs using LS-DYNA to alter the design parameters of the flip chips, such as thickness of the flip chip and size of the solder ball. It was found that a smaller chip thickness, larger solder ball diameter, and using the Cu/Ni UBM can improve the drop lifetime of solder balls.