• 한국정밀공학회지
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• 제16권2호통권95호
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• pp.145-152
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• 1999

This paper presents the principle and experimental results of a non-contact surface roughness measurement by means of screen projected pattern of lase beam reflected from a polished surface. In the reflected laser beam pattern especially from a fine surface like ground or polished one, light intensity varies from the center fo the image to its boundary as the Gaussian distribution. The standard deviation of a light intensity distribution is assumed to be a good non-contact estimator for measuring the surface roughnes, because the light reflectivity is known to be well related with the surface roughness. This method doesn't need to discriminate between the specularly reflected light and the diffusely reflected one, whereas the scattered laser intensity method must do. Nor it needs to adjust the change of light intensity caused by environmental lights or specimen materials. Reflected laser beam pattern narrowly spreads out in the vertical direction to tiny scratches on the polished surface due to abrasives. The deeper the scratch the more the dispersion, which means the rougher surface. The standard deviation of the pattern is nearly in proportion to the surface roughness. Measurement errors by this method are shown to be below 10 percent compared with those obtained by a common contact method. The inclination of measuring unit from the normal axis causes the measurement errors up to 10 percent for an angle of 4 degree. Therefore the proposed method can be used as an on-the-machine quick roughness estimator within 10 percent measurement error.

• 한국안전학회지
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• 제6권4호
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• pp.58-65
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• 1991

In - process measurement of surface roughness is introduced which employs an optical method by using laser beam. This makes it possible to detect the surface roughness not only along the circurnferential path but also along the feed direction even during machining. The maximum roughness value is always abtainable from the reading along the feed direction.

• 한국군사과학기술학회지
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• 제2권2호
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• pp.157-165
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• 1999

Production and measurement of a super-polished few-ppm-scattering mirror substrate are investigated. In order to improve the surface roughness directly determining scattering, the super-polishing process using Bowl-Feed technique is tried. The surface quality of the super-polished substrate is estimated by the phase-measuring interferometer. For the reliable roughness measurement using the interferometer, data averaging method is applied so that the optimal data averaging condition, 30 phase-data averaging and 20 intensity-data averaging, minimizing the measurement error is experimently searched. Based on the optimal data averaging condition, surface roughness of home-made mirror substrate is measured to be less than $0.5{\AA}$ rms corresponding to 2-ppm total-integrated-scattering.

• Journal of Welding and Joining
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• 제21권7호
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• pp.65-70
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• 2003

Thermal emissivity is generally affected by surface situation of material such as roughness. In this study, the effect of surface roughness on measuring thermal emissivity is experimented. And emissivity measurement method and equipment using hemisperical mirror is also reviewed. As the result of this research, thermal emissivity increased as long as increasing surface roughness. So, surface roughness is a essential check point when we measure the emissivity.

• 한국정밀공학회지
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• 제21권4호
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• pp.79-87
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• 2004

The light pattern reflected from a machined surface contains some information like roughness and profile on the projected surface as expected in the Beckmann-Spizzichino model. In applying the theory into a real reliable measuring device, many parameters such as incident light power, wave length, spot size should be kept a constant optical value. However, the reflected light power is likely to change with the environmental noise, the variations of the light source, the reflectivity of the surface, etc. even though the incident light power is constant. In this study, a method for adjusting the incident light power to keep the reflected light power projected on a CMOS image sensor constant was proposed and a simple adjustment algorithm based on PI digital control was examined. Experiments verified that the proposed method made the surface roughness measurement better and more reliable even under variations of the height of light source.

• 한국안전학회지
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• 제7권4호
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• pp.73-83
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• 1992

A new technique for the measurement of surface roughness based on the Intensity fluctuations of laser light backscattered form a moving surface has been introduced. The developed method will be quite useful for evaluating the surface quality under machining with more detailed Information by detecting the surface roughness along both directions simultaneously.

• 한국정밀공학회:학술대회논문집
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• 한국정밀공학회 1996년도 춘계학술대회 논문집
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• pp.232-236
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• 1996

This paper deals with an on-the-machine measurement method for roughness of ground surface by using flux ratio of scattered lights. A sensor and control unit is developed so as to e applied to surface grinding processes. The performance of the sensor is compared with that of stylus. The experimental investigation shows that not onlythe sensor has good performance as a surface roughness sensor but alsothe sensor is very useful for monitoring grinding condition in order to detect ill-conditioned grinding or dressing time.

• 대한기계학회논문집A
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• 제32권4호
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• pp.347-353
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• 2008

Reflected light can be decomposed into specular and diffuse components according to the light reflectance theory and experiments. The specular component appears in smooth surfaces mainly, while the diffuse one is visible in rough surfaces mostly. Therefore, each component can be used in forming their correlations to a surface roughness. However, they cannot represent the whole surface roughness seamlessly, because each formulation is merely validated in their available surface roughness regions. To solve this problem, new approaches to properly blend two light components in all regions are proposed in this paper. First is the weighting function method that a blending zone and rate can be flexibly adjusted, and second is the neural network method based on the learning from the measurement data. Simulations based on the light reflectance theory were conducted to examine its performance, and then experiments conducted to prove the enhancement of the measurement accuracy and reliability through the whole surface roughness regions.

• 한국정밀공학회지
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• 제16권1호통권94호
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• pp.167-173
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• 1999

This paper presents results of monitoring grinding processes with on-the-machine measurement of surface roughness by using nux ratios of scattered lights. A compact, on-the-machine surface roughness sensor. which consists of a diodelaser and several optic units. is developed. The control unit is also developed. The developed sensor together with the controller is applied for monitoring grinding processes of two different grinding machines. Experimental results show that the nux ratios and their standard deviations measured by the developed sensor over the entire ground surface are useful for monitoring grinding conditions. In particular, the sensor and the control unit are proved to be useful for monitoring grinding processes in order to detect abnormal grinding conditions and dressing time.

• 대한기계학회:학술대회논문집
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• 대한기계학회 2003년도 춘계학술대회
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• pp.845-850
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• 2003

The scattered light pattern from a machined surface generally contains much information concerning the surface roughness. The light pattern can be acquired by optical system and analyzed by statistical method. This kind of surface roughness measurement system can be easily adopted on the machine measurement. But the fully assembled system is too complex to implement on small systems using micro-controller. This study proposes the idea of reducing the number of optical components by removing screen and examines image processing of a light pattern to minimize the negative result of incomplete optical system. And the Gaussian blur filtering is concluded to be the best method of proposed measurement system. Furthermore light intensity variation of image pattern can be treated as a signal, therefore FIR filtering gives the similar result of Gaussian blur effect.