• Journal of the Institute of Electronics Engineers of Korea SD
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• v.46 no.8
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• pp.6-11
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• 2009

The electro-optical characteristics of the Liquid Crystal on Silicon (hereinafter "LCOS") micro-display on vertically alignment (VA) mode were studied with 3-dimensional LC code. 5 different cell gaps, such as 1.4 ${\mu}m$, 1.8 ${\mu}m$, 2.1 ${\mu}m$, 2.4 ${\mu}m$ and 2.8 ${\mu}m$, were selected. The reflectance-voltage (R-V) characteristics, distribution of reflected light, reflectance, optical fill factor and contrast ratio were calculated and investigated depending on various cell gaps. Due to the surface anchoring effect, higher cell gap showed higher reflectance. However, considering the optical fill factor and contrast ratio, middle-height 2.1 ${\mu}m$ showed the best electro-optical characteristic. 0.7 inch Full-HD LCOS panels having same geometry and material property were fabricated. The reflected light intensity and contrast ratio were measured and the measured results were well-matched to the calculated results.

• Journal of the Korean Society of Environmental Restoration Technology
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• v.6 no.3
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• pp.9-16
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• 2003

In support of remote sensing applications for monitoring processes of the Earth system, research was conducted to analyze the basic spectral response related to background soil and vegetation cover characteristics in the visible and reflective infrared wavelengths. Surface samples of seven stations were examined. Five soils were from land-field and two soils from tideland areas. The vegetation cover experiment was conducted on seven soil samples with known natural moisture content (%) by weight. To study the effect of vegetation cover, spectral measurements were taken on five or six vegetation cover treatments of the seven soils with 3 replications in air dry conditions. For collecting RS base data, used spectro-radiometer that measures reflection characteristics between 300~1,100nm was used and measured the reflection of vegetation from bean leaves. The relationships were evaluated for both a general soil line and for the individual lines of five soils, under air-dried condition as well as different vegetation cover ratio, through the determination of the line parameters. As vegetation cover ratio in bean leaves increases, features of soil reflectance decrease and those of plant reflectance become more and more apparent. In proportion to vegetation cover rate, near-infrared reflectance increased and visible reflectance decreased. Analysis results are compared to commonly used vegetation indices(RVI and NDVI ).

• Journal of Wetlands Research
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• v.7 no.2
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• pp.121-132
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• 2005

To classify the surface sedimentary facies using IKONOS image collected over Hwangdo tidal flat in Cheonsu Bay, the optical reflectance was compared for characterizing various sedimentary environments such as grain size, tidal channel pattern and area ratio of surface remnant water. The intertidal DEM (Digital Elevation Model) was generated by echo-sounder for analyzing the relationship between IKONOS image and sedimentary environments including topography. The boundary of the optical reflectance between mud-mixed facies and sand facies was distinct, and discrimination of the associated sandbar feature was also possible. The mud-mixed facies coupled with intricate tidal channels is confined to the relatively hi호 topography of Hwangdo tidal flat. The boundary between mud and mixed flat was indistinct in IKONOS optical reflectance but it would have a difference in the area ratio of surface remnant water. The dark area in the image represented the well developed sand facies having a lot of surface remnant water due to the relatively low surface topography. The overall accuracy of characterizing the surface sediment facies by maximum likelihood classification method was 86.2 %. These results demonstrate that high spatial resolution satellite imagery such as IKONOS coupled with knowledge of grain size, surface remnant water and tidal channel network can be effectively used to characterize the surface sedimentary facies (mud, mixed and sand) network of the tidal flat environments.

• Journal of Sensor Science and Technology
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• v.26 no.6
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• pp.402-407
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• 2017

Characteristics of various material surface plasmon resonance (SPR) chips were investigated in angular interrogation mode and intensity interrogation mode. Among five metals, silver (Ag), gold (Au), copper (Cu), chromium (Cr) and titanium (Ti), three metals, Ag, Au and Cu were paid attention to since their characteristics can be easily analyzed in angular interrogation mode by investigating the change of their reflectance curves according to refractive index change from 1.331 to 1.335. Most of SPR chips with various configurations showed the similar property in angular interrogation mode. The application of the SPR chip made of Ag, Au and Cu or their combinations depends on their reflectance properties. In intensity interrogation mode, the operation range may be limited since the variation of the intensity was not linearly related to refractive index change ranging from 1.331 to 1.335. However, the SPR chip containing high ratio of Ag may be applicable to high sensitive detection due to their sharp reflectance curves in intensity interrogation mode.

• Journal of the Korean Institute of Electrical and Electronic Material Engineers
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• v.11 no.4
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• pp.314-320
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• 1998

In this study, we have investigated crystallization properties of $Te_x(Sb_{85}Ge_{15})_{100-x}$ (x=0.3, 0.5, 1.0) thin films prepared by thermal evaporation. The change of reflectance according to phase change from amorphous to crystalline phases with annealing and exposure of diode laser is measured b the n&k analyzer and the surface morphology between amorphous and crystalline phase is analyzed by SEM and AFM. The difference in reflectance($\DeltaR$) between amorphous and crystalline phase appears approximately 20% at the diode laser wavelength, 780nm in all prepared films. Especially, the reflectance difference,$\DeltaR$ comes up to about 30% in $Te_{0.5}(Sb_{85}Ge_{15})_{99.5}$ thin film. Also, amorphous-to-crystalline phase change is observed in all prepared films. As a result of the measurement of the reflectance using diode laser, the reflectance is increased in proportion to the laser power and exposure time in all films. As a result of observing each film with the SEM and AFM, the surface morphology of the annealed and the exposed films are evidently increased than those of as-deposited films. The fast crystallization is occurred by increasing in Te content. Therefore, we conclude that the $Te_{0.5}(Sb_{85}Ge_{15})_{99.5}$ and $Te_1(Sb_{85}Ge_{15})_{99}$ thin films can be evaluated as an attractive optical recording medium with high contast ratio and fast erasing time due to crystallization.

• Journal of the Korean Association of Geographic Information Studies
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• v.4 no.1
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• pp.18-26
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• 2001

Landsat TM band ratio algorithms were made by in-water optical measurement data of each sampling points for water quality monitoring of coastal area using Landsat TM satellite data. The algorithm was derived from in-water optical reflectance data which was measuring by the PRR(profiling reflectance radiometer). And, in-water optical reflectance data were applied to Landsat TM bands. Relationship between in-water optical reflectance and pigments proposed by the ratio of TM band 1 and band 2 showed to as follows; $Y=3.8352{\times}(R(band\;1)/R(band\;2))^{-2.1978}$ ($R^2$=0.7069) and, relationship of the ratio of TM band 1 and band 3 as follows; $Y=23.288{\times}(R(band\;1)/R(band\;3))^{-1.5243}$ ($R^2$=0.8062). Calculated the upwelling radiance of water surface and radiance of TM showed the ratio of atmospheric effect. In the coastal area Rayleigh and Mie scattering of atmosphere is to make over 80% of normalized radiance of Landsat TM. In order to apply in-water algorithm obtained by PRR, we had to calculate the atmospheric effects at sampling site. And, the quantitative analysis of in-water components using Landsat TM data need the calibration of in-water algorithm and effective method of atmospheric correction.

• Proceedings of the Korean Vacuum Society Conference
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• 2016.02a
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• pp.419-419
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• 2016

High efficiency silicon solar cell requires the textured front surface to reduce reflectance and to improve the light trapping. In case of mono-crystalline silicon solar cell, wet etching with alkaline solution is widespread. However, the alkali texturing methods are ineffective in case of multi-crystalline silicon wafer due to grain boundary of random crystallographic orientation. The acid texturing method is generally used in multi-crystalline silicon wafer to reduce the surface reflectance. However the acid textured solar cell gives low short-circuit current due to high reflectivity while it improves the open-circuit voltage. To reduce the reflectivity of multi-crystalline silicon wafer, double texturing method with combination of acid and reactive ion etching is an attractive technical solution. In this paper, we have studied to optimize RIE experimental condition with change of RF power (100W, 150W, 200W, 250W, 300W). During experiment, the gas ratio of SF6 and O2 was fixed as 30:10.

• Proceedings of the KSRS Conference
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• 2003.11a
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• pp.663-665
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• 2003

A field spectroradiometer SE-590 was used to measure the spectral reflectance of water body. The reflectance was calculated as the ratio of surface water radiance to the standard whiteboard radiance nearly measured at the same time. Water samples were taken simultaneously for determining their chlorophyll-a, suspended solid (SS) and transparency. The relationships between those water quality parameters and spectral reflectance were analy zed using stepwise multiple regression to derive optimal prediction models . The multiple regression was also applied to the SE-590 simulated SPOT bands. The SPOT image of the same day was also analyzed using the same method to compare the statistical results. It showed that the multiple regression models using the SE-590 reflectance data got the best water quality prediction results. The evaluated RMS error of chlorophyll-a, SS and transparency of water quality parameters were 0.57 ug/l, 0.2 mg/l and 0.17 m, respectively, and the RMS errors were 0.36 ug/l, 0.49 mg/l and 0.42 m for SPOT data, respectively. The SE-590 simulated SPOT three bands data obtained the worst results and the RMS errors were 1.77 ug/l, 0.49 mg/l and 0.37 m, respectively.

• Korean Journal of Air-Conditioning and Refrigeration Engineering
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• v.26 no.12
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• pp.565-571
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• 2014

Nowadays, to make buildings light weight and aesthetically pleasing, curtain wall structure are commonly used. Therefore, window to wall ratio is increasing, which has caused cooling and heating load in crease in buildings as well. This phenomenon has negative impact from energy point of view. This paper analyzes window and wall convective heat gain when the slat reflectance of external and internal blinds are changed for the better understanding of the fundamentals behind the phenomena. It was observed that, if slat reflectance is increased, window transmitted solar increases and convection heat rate is clearly affected. Among six surfaces including four walls, ceiling and floor, maximum convection heat rate occurs on the south wall in summer. On the other hand, ceiling and floor showed the lowest convection heat gain, since they are shared by adjacent floors.

• Journal of the Korean Vacuum Society
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• v.19 no.2
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• pp.114-120
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• 2010

Conventional surface texturing in crystalline silicon solar cell have been use wet texturing by Alkali or Acid solution. But conventional wet texturing has the serious issue of wafer breakage by large consumption of wafer in wet solution and can not obtain the reflectance below 10% in multi crystalline silicon. Therefore it is focusing on RIE texturing, one method of dry etching. We developed large scale plasma RIE (Reactive Ion Etching) equipment which can accommodate 144 wafers (125 mm) in tray in order to provide surface texturing on the silicon wafer surface. Reflectance was controllable from 3% to 20% in crystalline silicon depending on the texture shape and height. We have achieved excellent reflectance below 4% on the weighted average (300~1,100 nm) in multi crystalline silicon using plasma texturing with gas mixture ratio such as $SF_6$, $Cl_2$, and $O_2$. The texture shape and height on the silicon wafer surface have an effect on gas chemistry, etching time, RF frequency, and so on. Excellent conversion efficiency of 16.1% is obtained in multi crystalline silicon by RIE process. In order to know the influence of RF frequency with 2 MHz and 13.56 MHz, texturing shape and conversion efficiency are compared and discussed mutually using RIE technology.