• 제목/요약/키워드: superstrate layer

검색결과 20건 처리시간 0.026초

얇은 금속 중간층이 포함된 광섬유-평면도파로 결합기 (Fiber-to-planar waveguide coupler with a thin metal intermediate layer)

  • 김광택;윤대성;손경락
    • 한국광학회지
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    • 제14권4호
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    • pp.355-358
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    • 2003
  • 얇은 금속 중간층이 있는 광섬유-평면도파로 결합기의 편광 및 파장 선택적 결합특성에 관한 실험 결과를 보고한다. 금속 박막층의 두께와 최상부층의 굴절률이 소자의 특성에 미치는 영향을 측정하고 그 결과를 설명하였다. 제안된 소자는 편광기, 광변조기 및 광센서 등의 다양한 응용 가능성을 보였다.

비정질 실리콘 태양전지 고효율화를 위한 전면투명전도막/p 최적연구 (A optimum studies of TCO/p-layer for high Efficiency in Amorphous Silicon Solar cell)

  • 이지은;이정철;오병성;송진수;윤경훈
    • 한국신재생에너지학회:학술대회논문집
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    • 한국신재생에너지학회 2007년도 추계학술대회 논문집
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    • pp.275-277
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    • 2007
  • 유리를 기판으로 하는 superstrate pin 비정질 태양전지에서 전면투명전도막(TCO)과 p-layer의 계면이 태양전지의 효율을 내는데 가장 큰 기여를 한다. 전면투명전도막(TCO)으로 현재 일반적으로 사용되는 ZnO:Al는 $SnO_2:F$ 보다 전기,광학적으로 우수하고, 안개율(Haze)높으며, 수소 플라즈마에서의 안정성이 높은 특정을 갖고 있다. 그래서 박막 태양전지 특성향상에 매우 유리하나, 태양전지로 제조했을 때, $SnO_2:F$보다 충진율(Fill factor:F.F)과 V_{\infty}$ 가 감소한다는 단점을 가지고 있다. 본 실험실에서는 $SnO_2:F$의 F.F가 72%이 나온 반면 ZnO:Al의 F.F은 68%에 그쳤다. 이들 원인을 분석하기 위해 TCO/p-layer의 전기적 특성을 알아 본 결과, $SnO_2:F$보다 ZnO:Al의 직렬저항이 높게 측정되었다. 이러한 결과를 바탕으로 p-layer 에 R={$H_2/SiH_4$}=25로 변화, p ${\mu$}c$-Si:H/p a-SiC:H 로 p-layer 이중 증착, p-layer의 boron doping 농도를 증가시키는 실험을 하였다. 직렬저항이 가장 낮았던 p ${\mu$}c$-Si:H/p a-SiC:H 로 p-layer 이중 증착에서 Voc는 0.95V F.F는 70% 이상이 나왔다. 이들 각 p층의 $E_a$(Activation Energy)를 구해본 결과, ${\mu$}c$-Si:H의 Ea 가 가장 낮은 것을 관찰 할 수 있었다.

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비정질 실리콘 태양전지에서 투명전도막/p층 계면 특성분석 (The characteristic analysis of TCO/p-layer interface in Amorphous Silicon Solar cell)

  • 이지은;이정철;오병성;송진수;윤경훈
    • 신재생에너지
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    • 제3권4호
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    • pp.63-68
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    • 2007
  • 유리를 기판으로 하는 superstrate pin 비정질 실리콘 태양전진에서 전면 투명전도막(TCO)과 p-층의 계면은 태양전지 변환효율에 큰 영향을 미친다. 면투명전도막(TCO)으로 현재 일반적으로 사용되는 ZnO:Al는 $SnO_2:F$보다 전기, 광학적으로 우수하고, 안개율 (Haze)높으며, 수소 플라즈마에서 안정성이 높은 특징을 갖고 있다. 그래서 박막 태양전지의 특성향상에 매우 유리하나, 태양전지로 제조했을 때, $SnO_2$보다 충진율(Fill Factor:F.F)과 $V_{oc}$가 감소한다는 단점을 가지고 있다. 본 실험실에서는 $SnO_2:F$dml F.F.가 72%이 나온 반면 ZnO:Al의 F.F은 68%에 그쳤다. 이들 원인을 분석하기 위해 TCO/p-layer의 전기적 특성을 알아 본 결과, $SnO_2:F$보다 ZnO:Al의 직렬저항이 높게 측정되었다. 이러한 결과를 바탕으로 p-layer에 $R=(H_2/SiH_4)=25$로 변화, p ${\mu}c$-Si:H/p a-SiC:H로 p-layer 이중 증착, p-layer의 boron doping 농도를 증가시키는 실험을 하였다. 직렬저항이 가장 낮았던 p ${\mu}c$-Si:H/p a-SiC:H 인 p-layer 이중 증착에서 $V_{oc}$는 0.95V F.F는 70%이상이 나왔다. 이들 각 p층의 $E_a$(Activiation Energy)를 구해본 결과, ${\mu}c$-Si:H의 Ea 가 가장 낮은 것을 관찰 할 수 있었다.

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Triple junction 태양전지의 a-SiGe middle cell에 관한 연구 (Study of hydrogenated a-SiGe cell for middle cell of Triple junction solar cell)

  • 박태진;백승조;김범준
    • 한국신재생에너지학회:학술대회논문집
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    • 한국신재생에너지학회 2010년도 춘계학술대회 초록집
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    • pp.83.1-83.1
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    • 2010
  • Hydrogenated a-SiGe middle cell for triple junction solar cell was investigated with various process parameters. a-SiGe I-layer was deposited at substrate temperature $245^{\circ}C$ and hydrogen content(R) was up to 26.7. Low optical bandgap(1.45eV) of a-SiGe cell was applied for middle cell although a-SiGe single cell efficiency with low Ge content was higher. And this cell was applied to the middle cell of a glass superstrate type a-Si/a-SiGe/uc-Si triple junction solar cell. The triple junction solar cell was resulted in the initial efficiency of about 9%, area $0.25cm^2$, under global AM 1.5 illumination.

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Design and Analysis of Double-Layered Microwave Integrated Circuits Using a Finite-Difference Time-Domain Method

  • Ming-Sze;Hyeong-Seok;Yinchao
    • KIEE International Transactions on Electrophysics and Applications
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    • 제4C권6호
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    • pp.255-262
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    • 2004
  • In this paper, a number of double-layered microwave integrated circuits (MIC) have been designed and analyzed based on a developed finite-difference time-domain (FDTD) solver. The solver was first validated through comparisons of the computed results with those previously published throughout the literature. Subsequently, various double-layered MIC printed on both isotropic and anisotropic substrates and superstrates, which are frequently encountered in printed circuit boards (PCB), have been designed and analyzed. It was found that in addition to protecting circuits, the added superstrate layer can increase freedoms of design and improve circuit performance, and that the FDTD is indeed a robust and versatile tool for multilayer circuit design.

마이크로파 응용을 위한 Interdigital capacitor의 간단한 모델 (Simple model of interdigital capacitors for microwave applications)

  • 유희욱;이명식;김동호;안호명;고중혁
    • 한국전기전자재료학회:학술대회논문집
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    • 한국전기전자재료학회 2005년도 추계학술대회 논문집 Vol.18
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    • pp.198-199
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    • 2005
  • Conformal mapping based models are given for interdigital capacitors on substrates with a thin superstrate and covering dielectric thin film. This model is useful for a wide range of dielectric constant and layer thickness. Interdigital capacitors with finger numbers n>3 are discussed.

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Ferrite-based wideband circularly polarized microstrip antenna design

  • Mashhadi, Mostafa;Komjani, Nader;Rejaei, Behzad;Ghalibafan, Javad
    • ETRI Journal
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    • 제41권3호
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    • pp.289-297
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    • 2019
  • In this paper, a wideband, circularly polarized patch antenna is proposed that leverages the unidirectional resonant modes of a circular patch mounted on top of a grounded dielectric-ferrite substrate. The proposed antenna is fed via the proximity coupling method and several parasitically coupled patches are placed on a dielectric superstrate to enhance the impedance bandwidth of the antenna. The resonant modes of the structure rotate only in the clockwise or counter clockwise directions. In the frequency range where the effective permeability of the ferrite layer is negative, the resonance frequencies of these modes differ significantly, which produces a large axial ratio (AR) bandwidth. For the proposed antenna, the numerical results show the 10 dB impedance bandwidth to be around 44% and the 3 dB axial ratio bandwidth to be higher than 64%.

Prevention of P-i Interface Contamination Using In-situ Plasma Process in Single-chamber VHF-PECVD Process for a-Si:H Solar Cells

  • Han, Seung-Hee;Jeon, Jun-Hong;Choi, Jin-Young;Park, Won-Woong
    • 한국진공학회:학술대회논문집
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    • 한국진공학회 2011년도 제40회 동계학술대회 초록집
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    • pp.204-205
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    • 2011
  • In thin film silicon solar cells, p-i-n structure is adopted instead of p/n junction structure as in wafer-based Si solar cells. PECVD is a most widely used thin film deposition process for a-Si:H or ${\mu}c$-Si:H solar cells. For best performance of thin film silicon solar cell, the dopant profiles at p/i and i/n interfaces need to be as sharp as possible. The sharpness of dopant profiles can easily achieved when using multi-chamber PECVD equipment, in which each layer is deposited in separate chamber. However, in a single-chamber PECVD system, doped and intrinsic layers are deposited in one plasma chamber, which inevitably impedes sharp dopant profiles at the interfaces due to the contamination from previous deposition process. The cross-contamination between layers is a serious drawback of a single-chamber PECVD system in spite of the advantage of lower initial investment cost for the equipment. In order to resolve the cross-contamination problem in single-chamber PECVD systems, flushing method of the chamber with NH3 gas or water vapor after doped layer deposition process has been used. In this study, a new plasma process to solve the cross-contamination problem in a single-chamber PECVD system was suggested. A single-chamber VHF-PECVD system was used for superstrate type p-i-n a-Si:H solar cell manufacturing on Asahi-type U FTO glass. A 80 MHz and 20 watts of pulsed RF power was applied to the parallel plate RF cathode at the frequency of 10 kHz and 80% duty ratio. A mixture gas of Ar, H2 and SiH4 was used for i-layer deposition and the deposition pressure was 0.4 Torr. For p and n layer deposition, B2H6 and PH3 was used as doping gas, respectively. The deposition temperature was $250^{\circ}C$ and the total p-i-n layer thickness was about $3500{\AA}$. In order to remove the deposited B inside of the vacuum chamber during p-layer deposition, a high pulsed RF power of about 80 W was applied right after p-layer deposition without SiH4 gas, which is followed by i-layer and n-layer deposition. Finally, Ag was deposited as top electrode. The best initial solar cell efficiency of 9.5 % for test cell area of 0.2 $cm^2$ could be achieved by applying the in-situ plasma cleaning method. The dependence on RF power and treatment time was investigated along with the SIMS analysis of the p-i interface for boron profiles.

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ZnO:Al 투명전도막을 이용한 높은 개방전압을 갖는 비정질 실리콘 박막 태양전지 제조 (Amorphous silicon thin-film solar cells with high open circuit voltage by using textured ZnO:Al front TCO)

  • 이정철;안세진;윤재호;송진수;윤경훈
    • 신재생에너지
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    • 제2권3호
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    • pp.31-36
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    • 2006
  • Superstrate pin amorphous silicon thin-film(a-Si:H) solar cells are prepared on $SnO_2:F$ and ZnO:Al transparent conducting oxides(TCO) in order to see the effect of TCO/p-layers on a-Si:H solar cell operation. The solar cells prepared on textured ZnO:Al have higher open circuit voltage VOC than cells prepared on $SnO_2:F$. Presence of thin microcrystalline p-type silicon layer(${\mu}c-Si:H$) between ZnO:Al and p a-SiC:H plays a major role by causing improvement in fill factor as well as $V_{OC}$ of a-Si:H solar cells prepared on ZnO:Al TCO. Without any treatment of pi interface, we could obtain high $V_{OC}$ of 994mV while keeping fill factor(72.7%) and short circuit current density $J_{SC}$ at the same level as for the cells on $SnO_2:F$ TCO. This high $V_{OC}$ value can be attributed to modification in the current transport in this region due to creation of a potential barrier.

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ZnO:Al 투명전도막을 이용한 높은 개방전압을 갖는 비정질 실리콘 박막 태양전지 제조 (Amorphous silicon thin-film solar cells with high open circuit voltage by using textured ZnO:Al front TCO)

  • 이정철;;이준신;송진수;윤경훈
    • 한국신재생에너지학회:학술대회논문집
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    • 한국신재생에너지학회 2006년도 춘계학술대회
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    • pp.158-161
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    • 2006
  • Superstrate pin amorphous silicon thin-film (a-Si:H) solar cells are prepared on $SnO_2:F$ and ZnO:Al transparent conducting oxides (TCO) In order to see the effect of TCO/P-layers on a-Si:H solar cell operation. The solar cells prepared on textured ZnO:Al have higher open circuit voltage $V_{oc}$ than cells prepared on $SnO_2:F$. Presence of thin microcrystalline p-type silicon layer $({\mu}c-Si:H)$ between ZnO:Al and p a-SiC:H plays a major role by causing improvement in fill factor as well as $V_{oc}$, of a-Si:H solar cells prepared on ZnO:Al TCO. Without any treatment of pi interface, we could obtain high $V_{oc}$, of 994mv while keeping fill factor (72.7%) and short circuit current density $J_{sc}$ at the same level as for the cells on $SnO_2:F$ TCO. This high $V_{oc}$ value can be attributed to modification in the current transport in this region due to creation of a potential barrier.

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