• Title/Summary/Keyword: spot scanning

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Photoelectron spectro-microscopy/Scanning photoelectron microscopy (SPEM) (광전자 분광현미경학)

  • Shin, Hyun-Joon
    • Vacuum Magazine
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    • v.3 no.4
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    • pp.8-13
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    • 2016
  • The need of space-resolved x-ray photoelectron spectroscopy (XPS) has developed scanning photoelectron microscopy (SPEM). SPEM provides space-resolved XPS data from a spot of a sample as well as images of specific element, chemical state, valency distribution on the surface of a sample. Based on technical advancement of tight x-ray focusing, sample positioning accuracy, and electron analyzer efficiency, SPEM is now capable of providing ~100 nm space resolution for typical XPS functionality, and SPEM has become actively applied for the investigation of chemical state, valency, and electronic structure on the surface of newly discovered materials, such as graphene layers, dichalcogenide 2D-materials, and heterogenous new functional materials.

An Efficiency Assessment for Reflectance Normalization of RapidEye Employing BRD Components of Wide-Swath satellite

  • Kim, Sang-Il;Han, Kyung-Soo;Yeom, Jong-Min
    • Korean Journal of Remote Sensing
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    • v.27 no.3
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    • pp.303-314
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    • 2011
  • Surface albedo is an important parameter of the surface energy budget, and its accurate quantification is of major interest to the global climate modeling community. Therefore, in this paper, we consider the direct solution of kernel based bidirectional reflectance distribution function (BRDF) models for retrieval of normalized reflectance of high resolution satellite. The BRD effects can be seen in satellite data having a wide swath such as SPOT/VGT (VEGETATION) have sufficient angular sampling, but high resolution satellites are impossible to obtain sufficient angular sampling over a pixel during short period because of their narrow swath scanning when applying semi-empirical model. This gives a difficulty to run BRDF model inferring the reflectance normalization of high resolution satellites. The principal purpose of the study is to estimate normalized reflectance of high resolution satellite (RapidEye) through BRDF components from SPOT/VGT. We use semi-empirical BRDF model to estimated BRDF components from SPOT/VGT and reflectance normalization of RapidEye. This study used SPOT/VGT satellite data acquired in the S1 (daily) data, and within this study is the multispectral sensor RapidEye. Isotropic value such as the normalized reflectance was closely related to the BRDF parameters and the kernels. Also, we show scatter plot of the SPOT/VGT and RapidEye isotropic value relationship. The linear relationship between the two linear regression analysis is performed by using the parameters of SPOTNGT like as isotropic value, geometric value and volumetric scattering value, and the kernel values of RapidEye like as geometric and volumetric scattering kernel Because BRDF parameters are difficult to directly calculate from high resolution satellites, we use to BRDF parameter of SPOT/VGT. Also, we make a decision of weighting for geometric value, volumetric scattering value and error through regression models. As a result, the weighting through linear regression analysis produced good agreement. For all sites, the SPOT/VGT isotropic and RapidEye isotropic values had the high correlation (RMSE, bias), and generally are very consistent.

Analysis of Specific Problems in Laser Scanning Optical System Design

  • Joo, Won-Don
    • Journal of the Optical Society of Korea
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    • v.15 no.1
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    • pp.22-29
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    • 2011
  • We analyze aberrations in an optical laser printer system in order to know how to determine an allowable non-uniformity of the movement of a light spot, how to determine allowed variation of spot sizes, and how to minimize the influence of these deviations on technological errors. In this paper, the correction and the tolerance of distortion are analyzed by using the concept of zonal and global distortions. The tolerance of field curvature is also obtained from Gaussian beam properties. In order to reduce the change of the entrance pupil position and to make a more compact laser printer system the minimum size of the rotator is exactly derived from the geometry with the introduction of the shift angle of the input beam.

The Spot Scanning Irradiation with $^{11}C$ Beams

  • Urakabe, Eriko;Kanai, Tatsuaki;Kanazawa, Mitsutaka;Kitagawa, Atsushi;Suda, Mitsuru;Iseki, Yasushi;Tomitani, Takehiro;Shimbo, Munefumi;Torikoshi, Masami
    • Proceedings of the Korean Society of Medical Physics Conference
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    • 1999.11a
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    • pp.188-191
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    • 1999
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Identification of the Imperfect Stage of Mycosphaerella nawae Causing Circular Leaf Spot of Persimmon in Korea (감나무 둥근무늬낙엽병균 Mycosphaerella nawae의 불완전 세대 동정)

  • 권진혁;강수웅;박창석;김희규
    • Korean Journal Plant Pathology
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    • v.14 no.5
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    • pp.397-401
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    • 1998
  • Asexual spores of Mycosphaerella nawae were profusely produced on PDA after a prolonged incubation at $25^{\circ}C$ for 90 days. When persimmon trees were artificially inoculated by the conidial suspension, typical symptoms of circular leaf spot of persimmon appeared on the leaves two month later. The imperfect stag of the fungus was identified as Ramularia sp. based on following morphological characteristics examined under a light microscope and a scanning electron microscope. Conidia were mostly ellipsoid, but occasionally cylindrical, elongated oval, taro, peanut or gourd shapes and measured as 12.2~32.6$\times$6.1~10.2 ${\mu}{\textrm}{m}$. erect, hyaline, colorless-light brown. Conidia were formed solitarily or in chains on a medium and infected leaves. Conidiophore was erect, hyaline, colorless-light brown. and the size was 20.4~102.0$\times$3.1~10.2 ${\mu}{\textrm}{m}$, respectively. In this paper, we firstly demonstratrated that asexual spores of M. nawae induced persimmon circular leaf spot in nature as well as sexual spores of the fungus. Therefore, it is hypothesized that the imperfect stage of the fungus plays an important role in nature for epidemics as secondary inoculum.

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Laser Processing for Manufacturing Styrofoam Pattern (주물용 스티로폼 목형 제작을 위한 레이저 가공 공정 개발)

  • 강경호;김재도
    • Proceedings of the Korean Society of Precision Engineering Conference
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    • 2001.04a
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    • pp.1085-1088
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    • 2001
  • The process of styrofoam pattern that has been used for material of press die pattern depends chiefly on handwork. Laser manufacturing system developed to increase precision and efficiency of process that is also able to convert the design easily. Applying the RP(rapid prototyping) concept reversely, the unnecessary part of section is vapored away by heat source of laser beam after converting 3-D CAD model into cross-sectional shape information. Laser beam is line-scanned in plane specimens to measure the depth and width of cut, surface roughness, cross-sectional shape as converting laser power, scanning speed, cutting gas pressure. With these basic data, plane surface, inclined surface, hole, outer contour trimming process is experimented and optimum condition are obtained. In plane and inclined surface experiments, 15W laser power and 50mm/s scanning speed make superior processing property and 30W, 10mm/s make processing efficiency increase in trimming process. With these results, simple patterns were manufactured and the possibility of applying laser manufacturing system to styrofoam pattern was convinced.

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Development of Dental Scanning Machine (치과용 Scanning 머신 개발)

  • 차영엽;동진근;오상천;이해형;송기창
    • Proceedings of the Korean Society of Precision Engineering Conference
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    • 2002.10a
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    • pp.562-565
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    • 2002
  • Recent technologic innovations have created possibilities for restorative dentistry, such as computer-aided design and computer-aided manufacturing. This article presents a CAD process that has been developed for the fabrication of dental restorations. This process uses a 4-axes driving mechanism and an improved optical displacement sensor, successfully applied in other industries. In optical displacement sensor, the light beam emitted from the LED is converged through the light source lenses and thrown on the object to be detected. When the light beam is reflected from the object, however, it is diffused. The diffused light beam is converged again by the receiver lenses and cast on the optical position detector element as a small spot.

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Realization for Each Element for capturing image in Scanning Electron Microscopy (주사 전자 현미경에서 영상 획득에 필요한 구성 요소 구현)

  • Lim, Sun-Jong;Lee, Chan-Hong
    • Laser Solutions
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    • v.12 no.2
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    • pp.26-30
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    • 2009
  • Scanning Electron Microscopy (SEM) includes high voltage generator, electron gun, column, secondary electron detector, scan coil system and image grabber. Column includes electron lenses (condenser lens and objective lens). Condenser lens generates fringe field, makes focal length and control spot size. Focal length represents property of lens. Objective lens control focus. Most of the electrons emitted from the filament, are captured by the anode. The portion of the electron current that leaves the gun through the hole in the anode is called the beam current. Electron beam probe is called the focused beam on the specimen. Because of the lens and aperture, the probe current becomes smaller than the beam current. It generate various signals(backscattered electron, secondary electron) in an interaction with the specimen atoms. In this paper, we describe the result of research to develop the core elements for low-resolution SEM.

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3D Measurement System of Wire for Automatic Pull Test of Wire Bonding (Wire bonding 자동 전단력 검사를 위한 wire의 3차원 위치 측정 시스템 개발)

  • Ko, Kuk Won;Kim, Dong Hyun;Lee, Jiyeon;Lee, Sangjoon
    • Journal of Institute of Control, Robotics and Systems
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    • v.21 no.12
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    • pp.1130-1135
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    • 2015
  • The bond pull test is the most widely used technique for the evaluation and control of wire bond quality. The wire being tested is pulled upward until the wire or bond to the die or substrate breaks. The inspector test strength of wire by manually and it takes around 3 minutes to perform the test. In this paper, we develop a 3D vision system to measure 3D position of wire. It gives 3D position data of wire to move a hook into wires. The 3D measurement method to use here is a confocal imaging system. The conventional confocal imaging system is a spot scanning method which has a high resolution and good illumination efficiency. However, a conventional confocal systems has a disadvantage to perform XY axis scanning in order to achieve 3D data in given FOV (Field of View) through spot scanning. We propose a method to improve a parallel mode confocal system using a micro-lens and pin-hole array to remove XY scan. 2D imaging system can detect 2D location of wire and it can reduce time to measure 3D position of wire. In the experimental results, the proposed system can measure 3D position of wire with reasonable accuracy.

A Parallel Mode Confocal System using a Micro-Lens and Pinhole Array in a Dual Microscope Configuration (이중 현미경 구조를 이용한 마이크로 렌즈 및 핀홀 어레이 기반 병렬 공초점 시스템)

  • Bae, Sang Woo;Kim, Min Young;Ko, Kuk Won;Koh, Kyung Chul
    • Journal of Institute of Control, Robotics and Systems
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    • v.19 no.11
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    • pp.979-983
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    • 2013
  • The three-dimensional measurement method of confocal systems is a spot scanning method which has a high resolution and good illumination efficiency. However, conventional confocal systems had a weak point in that it has to perform XY axis scanning to achieve FOV (Field of View) vision through spot scanning. There are some methods to improve this problem involving the use of a galvano mirror [1], pin-hole array, etc. Therefore, in this paper we propose a method to improve a parallel mode confocal system using a micro-lens and pin-hole array in a dual microscope configuration. We made an area scan possible by using a combination MLA (Micro Lens Array) and pin-hole array, and used an objective lens to improve the light transmittance and signal-to-noise ratio. Additionally, we made it possible to change the objective lens so that it is possible to select a lens considering the reflection characteristic of the measuring object and proper magnification. We did an experiment using 5X, 2.3X objective lens, and did a calibration of height using a VLSI calibration target.